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NIST Authors in Bold

Displaying 41201 - 41225 of 73697

Surface and Interface Properties of UV-Exposed PVDF/PMMA-CO-PEA Blends

March 5, 2003
Author(s)
Xiaohong Gu, Li Piin Sung, D L. Ho, Chris A. Michaels, D Nguyen, Y C. Jean, Tinh Nguyen
The surface and interface of PVDF blended with different amounts of poly (methyl methacrylate) and poly (ethyl acrylate) copolymer (PNMA-co-PEA) have been investigated before and after exposure to UV light. Dry free films having athickness of approximately

Thin Films of Collagen Affect Smooth Muscle Cell Morphology

March 4, 2003
Author(s)
John T. Elliott, Alessandro Tona, John T. Woodward IV, P L. Jones, Anne L. Plant
The purpose of this study was to provide a reproducible method for applying collagen to surfaces on which cells can be grown, and to characterize the resulting thin films of collagen protein with respect to molecular structure and cellular response

A Primary Standard for 157 nm Excimer Laser Measurements

March 1, 2003
Author(s)
Christopher L. Cromer, Marla L. Dowell, Richard D. Jones, Darryl A. Keenan, Shao Yang
Two primary standard calorimeters have been developed for accurate measurements of 157 nm (F2) excimer laser power and energy. The calorimeter specifications and design are discussed. Results from the construction and testing of the calorimeters, control

Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition

March 1, 2003
Author(s)
Jabez J. McClelland, W Anderson, C Bradley, M Walkiewicz, R Deslattes, E Jurdik, Robert Celotta
The pitch accuracy of a grating formed by laser-focused atomic deposition is evaluated from the point of view of fabricating nanoscale pitch standard artifacts. The average pitch obtained by the process, nominally half the laser wavelength, is simply

Airborne Smoke Sampling Package for Field Measurements of Fires

March 1, 2003
Author(s)
James R. Lawson, George W. Mulholland, H Koseki
A unique airborne smoke sample package (ASSP) for determining the smoke yield of large fires has been developed. The uncertainty in the average smoke yield at the 95% confidence interval is about +7% of the average of three repeat measurements. The ASSP

ALOFT-PC: A Smoke Plume Trajectory Model for Personal Computers

March 1, 2003
Author(s)
William D. Walton, Kevin B. McGrattan, J V. Mullin
As the understanding of the capabilities and limitations of in situ burning of oil spills increases, in situ burning continues to gain acceptance as an oil spill mitigation tool. One widely imposed criteria for the use of in situ burning is limiting the

Analysis of Performance Variation Using Query Expansion

March 1, 2003
Author(s)
Alan Smeaton
Information retrieval performance evaluation is commonly made based on the classical recall and precision based figures or graphs. However, important information indicating causes for variation may remain hidden under the average recall and precision

Asymptotic Behavior of a Strain Percolation Model for a Deforming Metal

March 1, 2003
Author(s)
Y Shim, Lyle E. Levine, R M. Thomson, D E. Kramer
In this paper, we present a recent advance in theoretical understanding of a deforming metal, using a strain percolation model which possibly explains spasmodic, fine slip line burst events occurring in the metal. The model addresses how the additional

Biometric Standards -- A Key to a More Secure World

March 1, 2003
Author(s)
Michael D. Hogan, Fernando L. Podio
Biometric technologies are becoming the foundation of an array of highly secure identification and verification solutions. Over the past eighteen months, the U.S has quickly worked to establish formal standards groups for accelerating and harmonizing the

Change Detection In XML Documents

March 1, 2003
Author(s)
K H. Lee, Y C. Choy, S B. Cho, Xiao Tang, V R. McCrary
This paper presents an efficient algorithm to detect changes between old and new versions of an XML document. The difference between the two versions can be considered to be an edit script that transforms one document tree into another. The proposed

Chemically Amplified Resist Fundamentals Studies by Combinatorial approaches

March 1, 2003
Author(s)
M Wang, Vivek Prabhu, Eric K. Lin, Michael J. Fasolka, Alamgir Karim
Sub-100 nm lithography requires more understanding of photoresist material properties and processing conditions to achieve necessary critical dimension control of patterned structures. As resist thickness and feature linewidth decrease, fundamental

Complex Permittivity Measurements of Common Plastics over Variable Temperatures

March 1, 2003
Author(s)
Billy F. Riddle, James R. Baker-Jarvis, Jerzy Krupka
In this paper we present complex permittivity data at macorwave frequencies for many common plastics from 125 K to 375 K. The measurements were made using a TE 01δ dielectric resonator placed inside an environmental chamber. Data are presented for the

Cracking and the Indentation Size Effect for Knoop Hardness of Glasses

March 1, 2003
Author(s)
George D. Quinn, P Green, K Xu
The Knoop Hardness of five glasses as measured over a wide range of indentation loads. Hardness decreased with increasing load in accordance with the classic indentation size effect (ISE). At moderate loads, cracking dramatically altered the indentation

Creation of a Dipolar Superfluid in Optical Lattices

March 1, 2003
Author(s)
B Damski, L Santos, E Tiemann, M Lewenstein, Svetlana A. Kotochigova, Paul S. Julienne, W.H. Zoller
We show that by loading a Bose-Einstein condensate (BEC) of two different atomic species into an optical lattice, it is possible to achieve a Mott-insulator phase with exactly one atom of each species per lattice site. A subsequent photo-association leads

Critical Dimension and Overlay Metrology

March 1, 2003
Author(s)
Michael T. Postek, Marylyn H. Bennett
Critical dimension and overlay metrology are two of the important measurements made in semiconductor device fabrication. Critical dimension metrology is important to ensure that the product meets the design target and overlay metrology ensures correct

Decay and Revival of Phase Coherence of a Bose-Einstein Condensate in a One-Dimensional Lattice

March 1, 2003
Author(s)
O Morsch, J H. Muller, D Ciampini, M Cristiani, P B. Blakie, Carl J. Williams, Paul S. Julienne, E Arimondo
The mode structure of a Bose-Einstein condensate non-adiabatically loaded into a one-dimensional optical lattice is studied by analyzing the visibility of the interference pattern as well as the radial profile of the condensate after a time-of-flight. A
Displaying 41201 - 41225 of 73697
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