Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 39551 - 39575 of 73830

Combinatorial Approach to Characterizing Epoxy Curing

January 1, 2004
Author(s)
Naomi Eidelman, D T. Raghavan, Aaron M. Forster, Eric J. Amis, Alamgir Karim
Three complementary techniques were used to follow the curing of a diglycidyl ether bisphenol A epoxy resin (DGEBA): FT-IR microspectroscopy, confocal microscopy, and axisymmetric adhesion testing. Each technique probes different characteristics of the

Combinatorial Screening of Cell-Material Interactions

January 1, 2004
Author(s)
N. R. Washburn, Carl Simon Jr., Michael Weir, L A. Bailey, S B. Kennedy, Eric J. Amis
Tissue engineering applications involve developing materials to guide cellular response in the repair of missing or damaged tissue. We have been developing combinatorial methods for characterizing the functional dependence of cellular responses on material

Combined NMR and XAS Study on Local Environments and Electronic Structures of the Electrochemically Li-Ion Deintercalated Li1-xCo1/3Ni1/3Mn1/302 Electrode System

January 1, 2004
Author(s)
W S. Yoon, C P. Grey, Mahalingam Balasubramanian, Xiao-Qing Yang, Daniel A. Fischer, James McBreen
Combined 6Li MAS NMR, in-situ metal K-edge (hard) XAS, and O K-edge (soft) XAS have been carried out during the first charging process for the layered Li1-xCo1/3Ni1/3Mn1/3O2 cathode material. The 6Li MAS NMR results showed the prescence of Li in the Ni2+

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004
Author(s)
Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter
We report on a comparative measurement of SiO 2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were

Comparison of Macro-Tip/Tilt and Mesoscale Position Beam-Steering Transducers for Free-Space Optical Communications Using a Quadrant Photodiode Sensor

January 1, 2004
Author(s)
K B. Fielhauer, B G. Boone, J R. Bruzzi, Jeffery Kluga, J R. Connelly, M M. Bierbaum, Jason J. Gorman, Nicholas Dagalakis
The National Aeronautics and Space Administration (NASA) plans to develop optical communication terminals for future spacecraft, especially in support of high data rate science missions and manned exploration of Mars. Future, very long-range missions, such

Condensation Flame of Acetylene Decomposition

January 1, 2004
Author(s)
Valeri I. Babushok, A W. Miziolek
Acetylene decomposition flame propagation was studied as the result of the condensation reaction. The used kinetic models reasonably predict the level of burning velocity of acetylene decomposition flame. Nevertheless the models do not demonstrate pressure
Displaying 39551 - 39575 of 73830
Was this page helpful?