Report on the 34th IUVSTA Workshop 'XPS: From Spectra to Results - Towards an Expert System'

Published

March 1, 2004

Author(s)

J E. Castle, Cedric J. Powell

Abstract

A summary is given of a Workshop titled XPS: From Spectra to Results Towards an Expert System that was held in St. Malo, France on April 22-26, 2002 under the sponsorship of the International Union of Vacuum Science, Technique and Applications (IUVSTA). This Workshop was held to develop the structure and initial content of a possible future expert system for X-ray photoelectron spectroscopy (XPS). Following three plenary presentations, the participants met in six groups to discuss the following topics: (a) instrument and specimen characterization; (b) experimental objectives; (c) wide-scan interpretation trial composition and structure; (d) protocols for narrow scans, instrument setup, and data acquisition; (e) reduction of narrow-scan data chemical-state and morphology analysis; and (f) reduction of narrow-scan data quantification. These discussions led to many recommendations for elements of an expert system for XPS. Some of these recommendations are included in this summary; additional recommendations are included in the reports of the six groups available on the internet (URL address to be added later).

Citation

Surface and Interface Analysis

Volume

36

Issue

No. 3

Pub Type

Journals

Keywords

data analysis, expert system, instrument characterization, sample characterization, surface analysis, workshop, x-ray photoelectron spectroscopy

Citation

Castle, J. and Powell, C. (2004), Report on the 34th IUVSTA Workshop 'XPS: From Spectra to Results - Towards an Expert System', Surface and Interface Analysis (Accessed May 2, 2026)

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