Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 39376 - 39400 of 73930

Nonequilibrium Quasiparticles and Periodicity in Single-Cooper-Pair Transistors

February 13, 2004
Author(s)
Joe Aumentado, Mark W. Keller, John M. Martinis, Michel H. Devoret
We have made single-Cooper-pair transistors in which we control the spatial profile of the superconducting gap energy by oxygen doping. The profile dramatically affects the switching current vs. gate voltage curve of the transistor, changing its period

Phenomenological Theory of Current-Induced Magnetization Precession

February 13, 2004
Author(s)
Mark D. Stiles, J Xiao, A Zangwill
We solve appropriate drift-diffusion and Landau-Lifshitz-Gilbert equations to demonstrate that unpolarized current flow from a non-magnet into a ferromagnet can produce a precession-type instability of the magnetization. The fundamental origin of the

High-Resolution Cavity Ring-Down Spectroscopy of H216O at 10687.36 cm-1

February 11, 2004
Author(s)
Joseph T. Hodges
We describe a frequency-stabilized cavity ring-down spectroscopy apparatus enabling high-resolution line shape measurements of water vapor. The measured line strength and broadening parameter for the H216O transition at 10687.36 cm-1 are compared to

Workflow Automation in a B2B Web-Portal Testbed

February 10, 2004
Author(s)
Marjane Mabrouk, Frederic J. de Vaulx, Tom Rhodes
The work described in this report, focused on specifying and managing different steps of a Business-to-Business (B2B) workflow by developing and integrating a Workflow Management System (WMS) within the NIST B2B Web-portal. This allows us to manage the

X-Ray Topography

February 4, 2004
Author(s)
David R. Black, Gabrielle G. Long
The study of the interrelationships between processing, structure and properties of materials is fundamental to the field of materials science and engineering. The need to understand the microstructure of materials has driven the development of a wide

Abraham's Force on a Highly Dispersive Medium

February 2, 2004
Author(s)
Paul D. Lett, L Wang
We consider the radiation force on highly dispersive media. In doing so we reconsider an experiment proposed to measure the Abraham force term in the stress-energy tensor at optical frequencies by measuring the displacement of a transparent dielectric

A New Optical Tweezers Technique Using a Holographic Crystal

February 1, 2004
Author(s)
E Edgu-Fry, Kristian Helmerson, Joseph E. Reiner, Rani B. Kishore
It has been shown previously that radiation pressure from a highly focused beam can be used to trap and manipulate objects in an aqueous media [1]. Over the past decade there have been several studies done by various groups to increase the ability of

Absolute Surface Coverage Measurement Using a Vibrational Overtone

February 1, 2004
Author(s)
A C. Pipino, J P. Hoefnagels, N Watanabe
Sub-monolayer absolute surface number densities are obtained by cavity ring-down spectroscopy (CRDS) for three haloethylenes with differing molecular symmetries on silica using the first C-H stretching overtones. Gas-phase CRDS measurements provide

Advanced Engineering Environments for Small Manufacturing Enterprises: Volume II

February 1, 2004
Author(s)
Steven J. Fenves, Ram D. Sriram, Young Choi, J P. Elm, J E. Robert
To assist the Small Manufacturing Enterprise (SME) in adopting Advanced Engineering Environments (AEEs), this report provides two self-assessment tools; the Self Assessment Tool for Engineering Environments (SAT-EE) to assist an SME in assessing the

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles

February 1, 2004
Author(s)
N G. Armstrong, W Kalceff, James Cline, John E. Bonevich
A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for
Displaying 39376 - 39400 of 73930
Was this page helpful?