U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 38001 - 38025 of 143737

Influence of Network Bond Percolation on the Thermal, Mechanical, Electrical and Optical Properties of high and low-k a-SiC:H Thin Films

August 25, 2013
Author(s)
Gheorghe Stan, Sean King, Jeff Bielefeld, Gaunghai Xu, William Lanford, Yusuke Matsuda, Reinhold Dauskardt, Jonathan F. Stebbins, Donald Hondongwa, Lauren Olasov, Brian Daly, Ming Liu, Dhanadeep Dutta, David W. Gidley
As demand for lower power and higher performance nano-electronic products increases, the semiconductor industry must adopt insulating materials with progressively lower dielectric constants (i.e. low-k) in order to minimize capacitive related power losses

QKD on a Board Limited by Detector Rates in a Free-Space Environment

August 25, 2013
Author(s)
Alan Mink, Joshua Bienfang
We discuss a high-speed quantum key distribution (QKD) system with the protocol infrastructure implemented on a single printed circuited board that can operate with various photonic subsystems. We achieve sub-nanosecond resolution with serial data

Overview of the NIST Open Keyword Search 2013 Evaluation Worksho

August 23, 2013
Author(s)
Jonathan G. Fiscus, Nancy Chen
The NIST Open Keyword Search 2013 (OpenKWS13) Evaluation Workshop was the culmination of the first in a series of community-wide evaluations to test research systems that search for keywords in audio of a "surprise" language. OpenKWS13 made use of the

Better Defining the Uncertainties for the AGA-8 Equation

August 22, 2013
Author(s)
Eric W. Lemmon
In order to revise the AGA-8 documentation for publication in 2014, better knowledge of the 0.1% uncertainty level in the equation of state is needed. A 0.1% uncertainty level has been identified by an AGA-8 task group as the acceptable limit of error for

ITL Publishes Guidance on Preventing and Handling Malware Incidents

August 22, 2013
Author(s)
Elizabeth B. Lennon
This ITL Bulletin summarizes a new ITL publication, NIST Special Publication 800- 83 Revision 1,Guide to Malware Incident Prevention and Handling for Desktops and Laptops,which gives receommendations for organizations to improve their malware incident

Photocurrent Mapping of 3D CdSe/CdTe Windowless Solar Cells

August 22, 2013
Author(s)
Carlos M. Hangarter, Ratan K. Debnath, Jong Y. Ha, M. E. Sahiner, C. J. Reehil, W. A. Manners, Daniel Josell
This paper details the use of scanning photocurrent microscopy to examine localized current collection efficiency of thin film photovoltaic devices with in-plane patterning at a submicrometer length scale. The devices are based upon two interdigitated comb
Displaying 38001 - 38025 of 143737
Was this page helpful?