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Search Publications

NIST Authors in Bold

Displaying 38026 - 38050 of 73697

Nanotechnology with Atom Optics

November 1, 2004
Author(s)
Jabez J. McClelland, Shannon B. Hill, M Pichler, Robert Celotta
A brief review of atom optics is presented, with emphasis on how it can be applied in the field of nanotechnology. Two specific examples are discussed: laser-focused atomic deposition and deterministic production of single atoms. Results are summarized for

NIST/XDS Test Kit, Version 1.3 & 1.4

November 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

NNI Workshop Instrumentation and Metrology for Nanotechnology

November 1, 2004
Author(s)
Michael T. Postek, J J. Pellegrino
The NNI Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenges was held on January 27-29, 2004 in Gaithersburg, Maryland, and was cosponsored by the National Institute of Standards and Technology (NIST), an agency of the

Ontology-Based Methods for Enhancing Autonomous Vehicle Path Planning

November 1, 2004
Author(s)
R Provine, Craig I. Schlenoff, Stephen B. Balakirsky, S Smith, M Uschold
We report the results of a first implementation demonstrating the use of an ontology to support reasoning about obstacles to improve the capabilities and performance of on-board route planning for autonomous vehicles. This is part of an overall effort to

Performance Evaluation of Low Rate WPANs for Sensors and Medical Applications

November 1, 2004
Author(s)
Nada T. Golmie, David E. Cypher, O Rebala
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric systems on a population approaching 1,000 individuals. Majority of prior studies of multimodal

Photoassociative Formation of Ultracold Polar KRb Molecules

November 1, 2004
Author(s)
Svetlana A. Kotochigova, Eite Tiesinga, Paul S. Julienne
We investigate the effectiveness of creating polar ground state KRb molecules by two-color photoassociative spectroscopy. In this process the molecules are formed from ultra-cold samples of K and Rb. Focussing on spin-polarized atoms we show that an

PMD measurement techniques and how to avoid the pitfalls

November 1, 2004
Author(s)
Paul A. Williams
This chapter presents a practical guide to PMD measurements including descriptions of the various measurement techniques and discussion of their associated sources of measurement error. Methods for mitigating these error sources are also discussed.

QA Framework: Specification Guidelines

November 1, 2004
Author(s)
Lynne S. Rosenthal, K Dubost, D Hazael-massieux, Lori Henderson
The goal of this document is to help W3C editors write better specifications, by making a specification easier to interpret without ambiguity and clearer as to what is required in order to conform. It focuses on how to define and specify conformance. It

R-22 Replacement Status

November 1, 2004
Author(s)
J M. Calm, Piotr A. Domanski
Since its initial recognition in 1928 and commercialization in 1936, R-22 has been applied in systems ranging from the smallest window air conditioners to the largest chillers and heat pumps, including those for district cooling and heating. Individual

Scanning Electron Microscopy Imaging of Hydraulic Cement Microstructure

November 1, 2004
Author(s)
Paul E. Stutzman
Microscopy of portland cement clinker and cementitous materials dates to the first petrographic microscope in the late 19th century. The development of the scanning electron microscope (SEM) with x-ray microanalysis allows the petrographer to study cements

Serrated Chip Morphology and Comparison with Finite Element Simulations

November 1, 2004
Author(s)
Laurent Deshayes, Robert W. Ivester, T Mabrouki, J F. Rigal
The complexity of chip formation in machining processes stems from the confluence of several physical phenomena - mechanical, thermal, and chemical - occurring at very high strain rate. The prediction of chip morphology depends on a fundamental

Simplifying and Interpreting Two-Tone Measurements

November 1, 2004
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, John Wood
We develop a mathematical description of the response of systems to second-order memory mechanisms based on a time-varying gain modulation function. We show that intermodulation products arising from interactions at baseband have different phase symmetries

Standards Electronic Automatic Computer (SEAC)

November 1, 2004
Author(s)
Russell A. Kirsch
The Standards Electronic Automatic Computer (SEAC) was the first programmable computer in the United States. The development of SEAC was a cooperative project between the National Bureau of Standards (NBS) team of computer engineers and world-class
Displaying 38026 - 38050 of 73697
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