Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Improved Radiometry For Extreme-Ultraviolet Lithography

Published

Author(s)

Charles S. Tarrio, Robert E. Vest, Steven E. Grantham, K Liu, Thomas B. Lucatorto, Ping-Shine Shaw

Abstract

The absolute cryogenic radiometer (ACR), an electrical-substitution-based detector, is the most accurate method for measurement of radiant power in the extreme ultraviolet. At the National Institute of Standards and Technology, ACR-based measurements are currently used as standards from the infrared and into the vacuum ultraviolet, however, no radiometric facilities are currently in operation with enough incident power to use an ACR in the extreme-ultraviolet region. Therefore, we have installed transfer optics on an existing beamline to allow the installation of the ACR as an additional endstation. We will describe the current radiometric beamline, the ACR, and the high-throughput beamline, and the transfer-optical system. Finally, we will present the performance of the transfer optics and measurements of the beam profile and incident power of the new endstation.
Proceedings Title
International Conference on Synchrotron Radiation Instrumentation
Volume
708
Conference Dates
August 25-29, 2003
Conference Title
AIP Conference Proceedings

Keywords

dosimetry, extreme ultraviolet, lithography, photodiodes, radiometry

Citation

Tarrio, C. , Vest, R. , Grantham, S. , Liu, K. , Lucatorto, T. and Shaw, P. (2004), Improved Radiometry For Extreme-Ultraviolet Lithography, International Conference on Synchrotron Radiation Instrumentation (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 2004, Updated February 17, 2017