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Displaying 36101 - 36125 of 74141

Realization of a Controllable Metafilm (''Smart Surface'') Composed of Resonant Magnetodielectric Particles: Measurements and Theory

November 1, 2005
Author(s)
Christopher L. Holloway, Pavel Kabos, Mohamed Mohamed, Edward Kuester, Michael D. Janezic, James R. Baker-Jarvis
In previous work, we derived generalized sheet-transition conditions (GSTCs) for the average electromagnetic fields across a metafilm, which, when properly designed, can have certain desired reflection and transmission properties. A metafilm is the two

Restructuring of Tungsten Thin Films Into Nanowires and Hollow Square Cross-Section Microducts

November 1, 2005
Author(s)
P. M. Parthangal, Richard E. Cavicchi, Christopher B. Montgomery, Shirley Turner, Michael R. Zachariah
We report on the growth of nanowires and unusual hollow microducts of tungsten by thermal treatment of tungsten films in a RF H2/Ar plasma at temperatures between 550-620 C. Nanowires with diameters of 10-30 nm and lengths between 50-300 nm were formed

Robust Optimization for Smart Machining System: An Enabler for Agile Manufacturing

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Robert W. Ivester, M A. Donmez
This paper reports our efforts towards developing a mathematical and information framework for optimization of machining processes within a Smart Machining System (SMS). An SMS uses diverse integrated technologies that enable an enterprise to: (1) produce

Scanning electron microscope dimensional metrology using a model-based library

November 1, 2005
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
The semiconductor electronics industry places significant demands upon secondary electron imaging to obtain dimensional measurements that are used for process control or failure analysis. Tolerances for measurement uncertainty and repeatability are smaller

Secure Messaging in BACnet

November 1, 2005
Author(s)
David G. Holmberg
A proposal for BACnet secure messaging is nearing public release by the BACnet standard committee (ASHRAE SSPC-135). The proposal adds a level of BACnet specific security to existing IT security, extending the BACnet standard to offer basic security using

Smart Machining Systems: Issues and Research Trends

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Alkan Donmez, Robert W. Ivester, David E. Gilsinn, Richard L. Rhorer, Eric P. Whitenton, Florian Potra
Smart Machining Systems (SMS) are an important part of Life Cycle Engineer-ing (LCE) since its capabilities include: producing the first and every product correct; improving the response of the production system to changes in demand (just in time)

Summary of the Panel Discussion on Opportunities and Needs

November 1, 2005
Author(s)
Cedric J. Powell
At the NIST Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology, there was a final panel discussion on opportunities and needs in this area. A summary is given of points made by some of the contributors in
Displaying 36101 - 36125 of 74141
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