Comparison and Status of Low-noise X-band Oscillator and Amplifier Technologies

Published

August 29, 2005

Author(s)

David A. Howe, Archita Hati

Abstract

his study compares the phase noise of different classes of oscillators and amplifiers that work at X-band. Best-in-class results are presented based on recent measurements at NIST. In particular, comparisons are made between mature technologies of multiplied quartz, sapphire dielectric in whispering gallery mode (WGM), and air-dielectric-resonator stabilized RF oscillators in contrast to various configurations of optical electronic oscillators (OEO), cavity stabilized, and atom-stabilized optical-domain oscillators and femtosecond-laser-comb frequency synthesizers. This study also reports the status of classes of low-noise X-band amplifiers, since high-spectral purity oscillators are constrained by amplifiers to varying degrees. Best-available low-noise X-band commercial amplifiers are compared with new feedforward, feedback, and array-gain test devices. Straight HBT and SiGeHBT technologies are compared in terms of phase noise. Results are at an operating frequency of 10 GHz.

Proceedings Title

Proc. Joint Mtg. IEEE Intl. Freq. Cont. Symp. and PTTI Mtg.

Conference Location

, USA

Pub Type

Conferences

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Keywords

amplifier X-band, cavity stabilized oscillator, dielectric resonator oscillator, low-noise X-band components, optical electronic oscillator, oscillator X-band, PM noise, silicon-germanium HBT

Citation

Howe, D. and Hati, A. (2005), Comparison and Status of Low-noise X-band Oscillator and Amplifier Technologies, Proc. Joint Mtg. IEEE Intl. Freq. Cont. Symp. and PTTI Mtg., , USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50223 (Accessed April 23, 2024)