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Displaying 35801 - 35825 of 74141

Characterization System for Embedded Gas Sensor Systems-on-a-Chip

December 1, 2005
Author(s)
Muhammad Y. Afridi, Allen R. Hefner Jr., Colleen E. Hood, Richard E. Cavicchi, Stephen Semancik
A characterization system is presented for evaluating critical functions of a microhotplate-based embedded gas-sensor for system-on-a-chip applications. The system uses a virtual instrument interface to control parts-per-billion (ppb) gas concentration

Chip-Scale Atomic Frequency References: Fabrication and Performance

December 1, 2005
Author(s)
John Kitching, Svenja A. Knappe, Li-Anne Liew, John M. Moreland, Hugh Robinson, Peter D. Schwindt, V Shah, V Gerginov, Leo W. Hollberg
The physics package for a chip-scale atomic frequency reference was constructed and tested. The device has a total volume of 9.5 mm 3, dissipates 75 mW of electrical power at an ambient temperature of 45 °C and has a short-term fractional frequency

Creation of a six-atom Schrodinger cat state

December 1, 2005
Author(s)
Dietrich G. Leibfried, Emanuel H. Knill, Signe Seidelin, Joseph W. Britton, Brad R. Blakestad, J Chiaverini, David Hume, Wayne M. Itano, John D. Jost, C. Langer, R Ozeri, Rainer Reichle, David J. Wineland
Among highly entangled states of multiple quantum systems, Schrödinger cat states are particularly useful. Cat states are equal superpositions of two maximally different quantum states. They are a fundamental resource in fault-tolerant quantum computing

Economic Analysis of Residential Fire Sprinkler Systems

December 1, 2005
Author(s)
Daniel M. Madrzykowski, R P. Fleming
This report designs and applies a comparative life-cycle cost analysis on two basic types of sprinkler system designs allowed by NFPA 13D a stand-alone residential sprinkler system and a multipurpose system using a network design. The life-cycle costs of

Effect of Initial Resist Thickness on Residual Layer Thickness of Nanoimprinted Structures

December 1, 2005
Author(s)
Hae-Jeong Lee, Hyun Wook Ro, Christopher L. Soles, Ronald L. Jones, Eric K. Lin, Wen-Li Wu, Daniel R. Hines
Accurate quantification and control of the residual layer thickness is a critical challenge to achieving sub-50 nm patterning with nanoimprint lithography. While characterization to within a few nanometers is essential, there is currently a lack of
Displaying 35801 - 35825 of 74141
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