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Displaying 35351 - 35375 of 74026

Measurement ''round robins'' support fiber standards development

January 1, 2006
Author(s)
Timothy J. Drapela
Interlaboratory measurement comparisons, or round robins, are a useful diagnostic tool during the standards-development process. The NIST Optoelectronics Division has coordinated, or provided data analysis for, numerous round robins for the fiberoptics

Measurement of the Response of a Ga Solar Neutrino Experiment to Ar-37 Source

January 1, 2006
Author(s)
V N. Gavrin, J N. Abdurashitov, V I. Barsanov, T J. Bowles, B T. Cleveland, S R. Elliott, S V. Girin, V V. Gorbachev, P P. Gurkina, W C. Haxton, T V. Ibragimova, A A. Janelidze, A V. Kalikhov, A I. Karpenko, N G. Khairnasov, Yu S. Khomyakov, T V. Knodel, A V. Korenkova, N A. Kotelnikov, K Lande, V V. Maltsev, S Y. Markov, V A. Matveev, I N. Mirmov, O V. Mishin, Jeffrey S. Nico, N N. Oshkanov, A Petrov, V M. Poplavsky, V V. Popov, V V. Selin, Z N. Shakirov, A A. Shikhin, A Suzuki, W A. Teasdale, A M. Tuchkov, B A. Vasiliev, E P. Veretenkin, V M. Vermul, S A. Voronov, J F. Wilkerson, V E. Yants, A A. Zamyatina, G T. Zatsepin, S B. Zlokazov

Measurement of the Response of a Ga Solar Neutrino Experiment to Neutrinos from an 37 Ar Source

January 1, 2006
Author(s)
J N. Abdurashitov, V N. Gavrin, S V. Girin, V V. Gorbachev, P P. Gurkina, T V. Ibragimova, A V. Kalikhov, N G. Khairnasov, T V. Knodel, V A. Matveev, I N. Mirmov, A A. Shikhin, E P. Veretenkin, V M. Vermul, V E. Yants, G T. Zatsepin, T J. Bowles, S R. Elliott, W A. Teasdale, B T. Cleveland, W C. Haxton, J F. Wilkerson, Jeffrey S. Nico, A Suzuki, K Lande, Yu S. Khomyakov, V M. Poplavsky, V V. Popov, O V. Mishin, A Petrov, B A. Vasiliev, S A. Voronov, A I. Karpenko, V V. Maltsev, N N. Oshkanov, A M. Tuchkov, V I. Barsanov, A A. Janelidze, A V. Korenkova, N A. Kotelnikov, S Y. Markov, V V. Selin, Z N. Shakirov, A A. Zamyatina, S B. Zlokazov

Micro FTIR Mapping of Nanometer Ferroelectric Polymer Films

January 1, 2006
Author(s)
Naomi Eidelman, N Tsutsumi, C. K. Chiang
Highly crystalline ferroelectric polymer nanometer ultra thin films were characterized with FTIR microspectroscopy mapping technique. The thickness of spin-coated vinyidene fluoride and trifluoroethylene P(VDF-TrFE) copolymer thin films was ranged from 260
Displaying 35351 - 35375 of 74026
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