NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 35051 - 35075 of 73697

Micro FTIR Mapping of Nanometer Ferroelectric Polymer Films

January 1, 2006
Author(s)
Naomi Eidelman, N Tsutsumi, C. K. Chiang
Highly crystalline ferroelectric polymer nanometer ultra thin films were characterized with FTIR microspectroscopy mapping technique. The thickness of spin-coated vinyidene fluoride and trifluoroethylene P(VDF-TrFE) copolymer thin films was ranged from 260

Molecular Beam Epitaxial Growth of High-Quality GaN Nanocolumns

January 1, 2006
Author(s)
J E. Van Nostrand, K L. Averett, R Cortez, J Boecki, C E. Stutz, Norman Sanford, Albert Davydov, J D. Albrecht
Vertically oriented GaN nanocolumns (NCs) approximately 90+10 nm wide and 0.75 microns tall were grown byt plasma-assisted molecular beam epitaxy on Al_(2)O_(3)(0001) and Si(111). The dense packing of the NCs gives them the appearance of a continuous film

Nano- and Atomic-Scale Length Metrology

January 1, 2006
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu
We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and specification of semiconductor devices as the dimensions of semiconductor devices shrink to the

Nano-Tip Electron Gun for the Scanning Electron Microscope

January 1, 2006
Author(s)
Andras Vladar, Zsolt Radi, Michael T. Postek, David C. Joy
Through this study the most important questions and problems associated with nano-tips and their possible applications to SEMs were investigated. These were related to the tip making procedures, the theoretical assessment of the Hitachi S-6000 critical
Displaying 35051 - 35075 of 73697
Was this page helpful?