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Displaying 35076 - 35100 of 73697

New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland
This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications

NGP RESEARCH ON FIRE SUPPRESSION CHEMISTRY

January 1, 2006
Author(s)
Gregory T. Linteris
Several NGP projects studied the mechanisms of chemical suppressants, including those containing halogens, phosphorus, and metals. From the work, several general principles of chemical flame inhibition are outlined. The present paper describes the

NIST Accomplishments in Nanotechnology

January 1, 2006
Author(s)
Michael T. Postek, Joseph J. Kopanski, David A. Wollman
This document includes a list of selected NIST accomplishments in nanotechnology for the period of fiscal years 2004 and 2005. These accomplishments are grouped into the NNI s Program Component Areas (PCAs), which are defined in the text. The NNI has

NIST Atomic Spectra Database (2006)

January 1, 2006
Author(s)
Yuri Ralchenko, Jeffrey R. Fuhr, F -. Jou, William C. Martin, Larissa Podobedova, Joseph Reader, Jean E. Sansonetti, Wolfgang L. Wiese

NIST Launches New Short Course in Display Metrology

January 1, 2006
Author(s)
Edward F. Kelley
The role the NIST Display Metrology Project has played in the display industry is reviewed. (1) the gamut assessment standard (GAS), (2) the Display Metrology Short Course, and (3) a measurement verification program.

NIST Reference Cryogenic Radiometer Designed for Versatile Performance

January 1, 2006
Author(s)
Jeanne M. Houston, Joseph P. Rice
We describe the concept of modularity and versatility in the construction of a new cryogenic radiometer developed at NIST. We address the benefits of the modular design in the construction and development and discuss some of the device characterizations
Displaying 35076 - 35100 of 73697
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