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Displaying 351 - 375 of 2736

National Institute of Standards and Technology Environmental Scan 2020

February 9, 2021
Author(s)
Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through four separate lenses

Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session

February 8, 2021
Author(s)
Jeremy Marvel, Roger D. Eastman, Geraldine S. Cheok, Kamel S. Saidi, Tsai H. Hong, Elena R. Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells
The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the special session

A system of quantities from software metrology

January 15, 2021
Author(s)
David Flater
International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system of quantities whose

CCQM-K143 Comparison of Copper Calibration Solutions Prepared by NMIs/DIs

December 24, 2020
Author(s)
John Molloy, Michael Winchester, Therese Butler, Olaf Rienitz, Volker Goerlitz, Anita Roethke, Volker Goerlitz, Rodrigo Caciano de Sena, Lu Yang, Kenny Nadeau, Patricia R. Arancibia, Wu Bing, Zhou Tao, James Snell, Jochen Vogl, Maren Koenig, R. K. Kotnala, S. Swarupa Tripathy, Christine Elishian, Rosi Ketrin, Toshihiro Suzuki, Tom Oduor Okumu, Yong-Hyeon Yim, Judith Velina Lara Manzano, Mirella Buzoianu, Alena Sobina, Veniamin Zyskin, Egor Sobina, Pavel Migal, Mare Linsky, Suleyman Z. Can, Betul Ari, Heidi Goenaga Infante
CCQM-K143 is a key comparison that assesses participants' ability to prepare single element calibration solutions. Preparing calibration solutions properly is the cornerstone of establishing a traceability link to the International System of Units (SI)

Comparison of primary laser spectroscopy and mass spectrometry methods for measuring mass concentration of gaseous elemental mercury

December 10, 2020
Author(s)
Abneesh Srivastava, Stephen E. Long, James E. Norris, Colleen E. Bryan Sallee, Jennifer Carney, Joseph Hodges
We present a direct comparison between two independent methods for the measurement of gaseous elemental mercury (GEM) mass concentration: isotope dilution cold-vapor inductively coupled plasma mass spectrometry (ID-CV-ICP-MS) and laser absorption

Certification of Standard Reference Material(R) 1992 / ERM(R)-FD305 Zeta Potential - Colloidal Silica (Nominal Mass Fraction 0.15 %)

November 24, 2020
Author(s)
Yannic Ramaye, Vikram Kestens, J. Charoud-Got, S. Mazoua, G. Auclair, Tae Joon Cho, Blaza Toman, Vincent A. Hackley, T. Linsinger
This report describes the production of SRM 1992/ERM-FD305, silica particles suspended in a borate buffer, certified for electrophoretic mobility and zeta potential by electrophoretic light scattering (ELS). This material was produced following ISO 17034

Certification of Standard Reference Material(R) 1993 / ERM(R)-FD306 Zeta Potential - Colloidal Silica (Nominal Mass Fraction 2.2 %)

November 24, 2020
Author(s)
Yannic Ramaye, Vikram Kestens, J. Charoud-Got, S. Mazoua, G. Auclair, Tae Joon Cho, Blaza Toman, Vincent A. Hackley, T. Linsinger
This report describes the production of SRM 1993/ERM-FD306, silica particles suspended in a borate buffer, certified for electrophoretic mobility and zeta potential by electrophoretic light scattering (ELS). This material was produced following ISO 17034

Calibration Procedures for Orthogonal Superposition Rheology

November 18, 2020
Author(s)
Ran Tao, Aaron M. Forster
Orthogonal superposition (OSP) rheology is an advanced rheological technique that involves superimposing a small-amplitude oscillatory shear deformation orthogonal to a primary shear flow. This technique allows the measurement of structural dynamics of

Error Quantification in Dynamic Applications of Weakly Nonlinear Transducers

November 3, 2020
Author(s)
Lautaro D. Cilenti, Akobuije Chijioke, Balakumar Balachandran
Characterization and quantification of dynamic measurements is an ongoing area of research in the metrological community as new calibration methods are being developed to address dynamic measurement applications. The development undertaken to date largely

Materials Research & Measurement Needs for Ceramics Additive Manufacturing

November 1, 2020
Author(s)
Andrew J. Allen, Igor Levin, Suzanne E. Witt
We report on a recent workshop dedicated to additive manufacturing (AM) of ceramics that was held at the National Institute of Standards and Technology (NIST) in November 2019. This two- day all-invited meeting brought together experts from industry

Report of the 104th National Conference on Weights and Measures

August 27, 2020
Author(s)
Yvonne A. Branden, Tina G. Butcher, Richard A. Harshman, Lisa Warfield, Gloria D. Lee, John W. Barton
The 104th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 - 18, 2019, at the Hyatt Regency Milwaukee Hotel, Milwaukee, Wisconsin. The theme of the meeting was "Assuring Equity in the Marketplace: NIST and NCWM

Binary pseudorandom array test standard optimized for characterization of large field-of-view optical interferometers

August 24, 2020
Author(s)
Valeriy V. Yashchuk, Sergey Babin, Stefano Cabrini, Weilun Chao, Ulf Griesmann, Ian Lacey, Stefano Marchesini, Keiko Munechika, Carlos Pina-Hernandez, Allen L. Roginsky
Recently, a technique for calibrating the modulation transfer function (MTF) of a broad variety of metrology instrumentation has been demonstrated. This technique is based on test samples structured as one-dimensional binary pseudo-random (BPR) sequences

Evaluation of NMIJ Traveling Dual Source Bridge Using NIST Adapted Wheatstone Bridge

August 24, 2020
Author(s)
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the resistance ratio by measuring the voltage ratio using a digital multimeter, 3458A. Based on the

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA

The Design of an Instrument to Realize Small Torque at NIST

August 22, 2020
Author(s)
Leon S. Chao, Rafael Marangoni, Frank C. Seifert, Darine El Haddad, Jon R. Pratt, David B. Newell, Stephan Schlamminger
After the recent redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated mass in a gravitational field suspended from a known lever arm and disseminated through a chain of torque transducers.An SI

A Toolbox for Isophase-Curvature Guided Computation of Metrology Holograms

August 13, 2020
Author(s)
Ulf Griesmann, Johannes A. Soons, Gufran S. Khan
We describe the algorithmic foundations of an open-source numerical toolbox, written in the Octave language, for the creation of computer-generated binary and multi-level holograms used in interferometric form error measurements of complex aspheric and
Displaying 351 - 375 of 2736
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