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Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session

Published

Author(s)

Jeremy Marvel, Roger D. Eastman, Geraldine S. Cheok, Kamel S. Saidi, Tsai H. Hong, Elena R. Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells

Abstract

The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the special session was to discuss the state of the art and metrics of TRLs for bin picking solutions that are robust against random pose and part variations. We sought to address maturity indicators for overcoming challenging factors in bin picking applications, including shape variations, pose and orientation uncertainty, weak or no distinguishing image features, and limited grasping options.
Citation
NIST Interagency/Internal Report (NISTIR) - 7876
Report Number
7876

Keywords

Bin Picking, Technology Readiness, 6DOF Metrology

Citation

Marvel, J. , Eastman, R. , Cheok, G. , Saidi, K. , Hong, T. , Messina, E. , Bollinger, B. , Evans, P. , Guthrie, J. , Hershberger, E. , Martinez, C. , McNamara, K. and Wells, J. (2021), Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7876 (Accessed September 27, 2021)
Created February 7, 2021, Updated February 8, 2021