NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 34526 - 34550 of 73697

High Throughput Microfluidic Light Scattering for Aqueous Polymer Solutions

March 10, 2006
Author(s)
A I. Norman, Wenhua Zhang, Kathryn L. Beers, Eric J. Amis
A small-angle light scattering (SALS) apparatus, coupled with a specially designed microfluidic device was used, to monitor the structure of a diblock copolymer in aqueous solution. The closed-face design was fabricated between glass slides using a UV

Optical Properties of Fluids For 248 nm and 193 nm Immersion Photolithography

March 10, 2006
Author(s)
Simon G. Kaplan, John H. Burnett
We present measured values of the refractive index, thermo-optic coefficient, and absorption coefficient of a number of common organic solvents and aqueous inorganic solutions that may have application in immersion photolithography at 248 nm or 193 nm

Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness

March 9, 2006
Author(s)
Donna C. Hurley, Malgorzata Kopycinska-Mueller, D Julthongpiput, Michael J. Fasolka
The effects of surface functionality and relative humidity (RH) on nanomechanical properties were investigated using atomic force acoustic microscopy (AFAM), a contact scanned probe microscopy (SPM) technique. Self-assembled monolayers (SAMs) with

Optical frequency measurements of 6s 2 S 1/2 - 6p 2 P 1/2 (D 1 )transitions in 133 Cs and their impact on the fine-structure constant

March 8, 2006
Author(s)
Vladislav Gerginov, K Calklins, B Tanner, John J. McFerran, Scott A. Diddams, Albrecht Bartels, Leo W. Hollberg
High resolution laser spectroscopy of 6s 2S 1/2 – 6p 2P 1/2 transition (D 1 line) in neutral 133Cs is performed in a highly collimated thermal atomic beam using a femtosecond laser frequency comb and narrow linewidth diode laser. The diode laser is offset

Optical frequency measurements of 6s 2 S 1/2 - 6p 2 P 1/2 (D1) transitions in 133 Cs and their impact on the fine-structure constant

March 8, 2006
Author(s)
Vladislav Gerginov, K Calklins, Carol Tanner, John J. McFerran, Scott A. Diddams, A Bartels, Leo W. Hollberg
High resolution laser spectroscopy of 6s 2S 1/2 – 6p 2P 1/2 transition (D1 line) in neutral 133Cs is performed in a highly collimated thermal atomic beam using a femtosecond laser frequency comb and narrow linewidth diode laser. The diode laser is offset

Radio Communications for Emergency Responders in Large Public Buildings: Comparing Analog and Digital Modulation

March 7, 2006
Author(s)
Catherine A. Remley, Marc Rutschlin, Dylan F. Williams, Robert T. Johnk, Galen H. Koepke, Christopher L. Holloway, Mike G. Worrell, Andy MacFarlane
To assess in-building radio coverage, in 2004 the City of Phoenix Fire Department carried out extensive testing of their radio systems. They deployed firefighters in standard configurations in a variety of buildings, and rated on a scale of 1 to 5 the

RFID-Assisted Indoor Localization and Communication for First Responders

March 7, 2006
Author(s)
Leonard E. Miller, Perry F. Wilson, Nelson P. Bryner, Michael H. Francis, Jeffrey R. Guerrieri, D W. Stroup, Luke Klein-Berndt
An indoor localization and communication project is described that proposes to use RFID tags, placed in the building beforehand, as navigation waypoints for an inertial navigation system carried by a first responder. The findings from the first year of the

Single electron tunnelling transistor with tunable barriers using silicon nanowire MOSFET

March 7, 2006
Author(s)
Akira Fujiwara, Hiroshi Inokawa, Kenji Yamazaki, Hideo Namatsu, Yasuo Takahashi, Neil M. Zimmerman, Stuart Martin
Single-electron tunnelling (SET) transistors 1 are now of great and wide interest as basic elements for future applications such as low-power nanoelecronics 2 and read-out electrometer for solid-state quantum computing 3. Silicon SET devices 4 have great

Early Results From the NIST M48 CMM in the New AML Facility

March 3, 2006
Author(s)
John R. Stoup, Bryon S. Faust, Theodore D. Doiron
The Advanced Measurement Laboratory at NIST in Gaithersburg has already provided real, measurable improvement in some dimensional metrology measurement processes at NIST, most notably in the performance of the NIST Moore M48 coordinate measuring machine1

Magnetic field-induced spectroscopy of strongly forbidden optical transitions

March 3, 2006
Author(s)
Alexey Taychenachev, V Yudin, Christopher W. Oates, C Hoyt, Zeb Barber, Leo W. Hollberg
We propose a method that uses a static magnetic field to enable direct optical excitation of forbidden electric dipole transitions that are otherwise prohibitively weak. The method is based on mixing of atomic states by a static magnetic field. The method

Legal and Technical Requirements for Time and Frequency Metrology

March 2, 2006
Author(s)
Michael A. Lombardi
Who needs time and frequency? This paper answers that question by discussing the technologies and applications that rely on precise time and frequency, and exploring their legal and technical requirements for measurement uncertainty. The technologies and

MINEX Performance and Interoperability of the INCITS 378 Fingerprint Template

March 2, 2006
Author(s)
Patrick Grother, R. McCabe, Craig I. Watson, Michael D. Indovina, Wayne J. Salamon, Patricia A. Flanagan, Elham Tabassi, Elaine M. Newton, Charles L. Wilson
While the interchange of fingerprint image data provides the greatest interoperability between dissimilar fingerprint recognition systems, standards exist that specify the location and formatting of processed minutiae locations data, or templates. Minutiae

Analysis of Charpy impact verification data: 1993-2003

March 1, 2006
Author(s)
Jolene D. Splett, Christopher N. McCowan
Indirect verification tests, used to verify the performance of Charpy impact machines according to ASTM Standard E23, are evaluated by the National Institute of Standards and Technology (NIST) and the data from these tests are co1lected in a database. The

Assembly Model Representation from Conceptual to the Detailed Design

March 1, 2006
Author(s)
Sudarsan Rachuri, Y H. Han, Sebti Foufou, Shaw C. Feng, Utpal Roy, Fujun Wang, Ram D. Sriram, Kevin W. Lyons
The important issue of mechanical assemblies has been a subject of intense research over the past several years. Most electromechanical products are assemblies of several components, for various technical as well as economic reasons. This paper provides an
Displaying 34526 - 34550 of 73697
Was this page helpful?