NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Extending CMOS Measurements to the Nanoscale

Published

Author(s)

David G. Seiler
Proceedings Title
Proceedings of the Seventh International Conference on Microelectronics and Interfaces (ICMI''06)
Conference Dates
March 6-10, 2006
Conference Location
Austin, TX
Conference Title
Seventh International Conference on Microelectronics and Interfaces (ICMI''06)
Pub Type
Conferences

Citation

Seiler, D. (2006), Extending CMOS Measurements to the Nanoscale, Proceedings of the Seventh International Conference on Microelectronics and Interfaces (ICMI''06), Austin, TX (Accessed October 1, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 7, 2006, Updated January 27, 2020
Was this page helpful?