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Displaying 33151 - 33175 of 74175

Vehicle Fire Suppression Research Needs

March 1, 2007
Author(s)
Anthony P. Hamins
This report identifies research needs in automotive fire protection. The work focuses on the problem of post-collision vehicle fires. Recent fire suppression research is cited with special attention given to results cited in the scientific literature as

Verification and Validation--How to Determine the Accuracy of Fire Models.

March 1, 2007
Author(s)
Mark H. Salley, Jason Dreisbach, Kendra Hill, Bijan Najafi, Francisco Joglar, Anthony Hamins, Kevin B. McGrattan, Richard Peacock, Robert Kassawara
Both domestically and worldwide, there is a movement to introduce risk-informed and performance-based analyses into fire protection engineering practice. One key tool needed to support risk-informed, performance-based (RI/PB) fire protection is fire models

Zero-Order Imaging of Device-Sized Overlay Targets Using Scatterfield Microscopy

March 1, 2007
Author(s)
Bryan M. Barnes, Lowell P. Howard, P Lipscomb, Richard M. Silver
Patterns of lines and trenches with nominal linewidths of 50 nm have been proposed for use as an overlay target appropriate for placement inside the patterned wafer die. The NIST Scatterfield Targets feature groupings of eight lines and/or trenches which

Length Fractionation of Carbon Nanotube Using Centrifugation

February 28, 2007
Author(s)
Jeffrey A. Fagan, Matthew Becker, Jae H. Chun, Erik K. Hobbie
A recent article by Arnold et al. (Nature Nanotech., 1, 60-65, 2006)1 demonstrated the use of ultracentrifugation on single wall carbon nanotubes (SWNTs) within a density gradient to produce chirality separation of the nanotubes. The authors of this letter

Low-Frequency Noise Characterizations of ZnO Nanowires Field Effect Transistors

February 28, 2007
Author(s)
Wenyong Wang, Hao Xiong, Monica D. Edelstein, David J. Gundlach, John S. Suehle, Curt A. Richter, Woong-Ki Hong, Takhee Lee
Field effect transistors (FETs) of single-crystalline ZnO nanowires have been fabricated and low frequency (f) noise characterizations of the ZnO nanowire FETs have been performed for the first time. The obtained noise power spectra show a pronounced 1/f

Thermal effects on the critical current of spin torque switching in spin valve nanopillars

February 28, 2007
Author(s)
Michael Schneider, Matthew Pufall, William Rippard, Stephen E. Russek, Jordan A. Katine
In spin valve nanopillars, temperature affects the spin torque reversal of the free magnetic layer. The authors compare values of zero temperature critical switching current I c0 extrapolated from room temperature pulsed current switching measurements to

Development of an Evaluation Method for Acceptable Usability

February 27, 2007
Author(s)
Brian C. Stanton, Brian Antonishek, Jean C. Scholtz
The National Institute of Standards and Technology (NIST) conducted three workshops with First Responders to determine requirements for robots used in Urban Search and Rescue (USAR). These requirements were further prioritized by the responders. NIST has

Enhancement of Engine Oil Wear and Friction Control Performance Through Titanium Additive Chemistry

February 27, 2007
Author(s)
J M. Guevremont, G H. Guinther, D Szemenyei, Mark Devlin, T-C Jao, Cherno Jaye, Joseph Woicik, Daniel A. Fischer
Traditionally, wear protection and friction modification by engine oil are provided by zinc dithiophosphate (ZDDP) or other phosphorus compounds. These additives provide effective wear protection and friction control on engine parts through formation of a

A chip-scale atomic magnetometer with improved sensitivity using the M x technique

February 26, 2007
Author(s)
P Schwindt, Brad Lindseth, Svenja A. Knappe, V Shah, John E. Kitching, Li-Anne Liew
We discuss the fabrication and performance of a miniature optically pumped atomic magnetometer constructed using microfabricated components. This device measures the spin precession frequency of an alkali atom to determine the magnetic field using the M x

Accuracy in Optical Image Modeling

February 26, 2007
Author(s)
James E. Potzick, Egon Marx, M P. Davidson
Wafer exposure process simulation and optical photomask feature metrology both rely on optical image modeling for accurate results. The best way to gauge the accuracy of an imaging model is to compare the model results with an actual image. Modeling

Interrogation of 'Surface', 'Skin' and 'Core' Orientation in Thermotropic Liquid-Crystalline Copolyester Moldings by Near-Edge X-Ray Absorption Fine Structure and Wide-Angle X-Ray Scattering

February 26, 2007
Author(s)
S Rendon, Robert A. Bubeck, L S. Thomas, W R. Burghardt, A Hexemer, Daniel A. Fischer
Injection molding of thermotropic liquid-crystalline polymers (TLCPs) can result in molded articles the exhibit complex orientation states that vary considerably as a function of depth in the part. Skin-core morphologies are often observed in TLCP moldings

Intrustion Detection and Prevention Systems

February 26, 2007
Author(s)
Shirley M. Radack
This bulletin summarizes the recommendations developed by NIST for organizations in the effective use of intrusion detection and prevention systems (IDPS). These software systems help organizations to monitor and analyze events occurring in their

Observation of Faraday waves in a Bose-Einstein condensate

February 26, 2007
Author(s)
Peter Engels, Colin Atherton, Mark Hoefer
Faraday waves in a cigar-shaped Bose-Einstein condensate are created. It is shown that periodically modulating the transverse confinement, and thus the nonlinear interactions in the BEC, excites small amplitude longitudinal oscillations through a

Standards Development for Wireless Communications for Urban Search and Rescue Robots

February 26, 2007
Author(s)
Kate Remley, Galen H. Koepke, Elena R. Messina, Adam S. Jacoff, George Hough
To gather data in support of standards development for urban search and rescue robots, NIST is conducting a series of field tests to quantify the functionality and performance of various candidate robots. During these tests, manufacturers bring robots that

Effect of Photoacid Generator Concentration and Developer Strength on the Patterning Capabilities of a Model EUV Photoresist

February 25, 2007
Author(s)
Kwang-Woo Choi, Vivek Prabhu, Kristopher Lavery, Eric K. Lin, Wen-Li Wu, John T. Woodward IV, Michael Leeson, H Cao, Manish Chandhok, George Thompson
Current extreme ultraviolet (EUV) photoresist materials do not yet meet requirements on exposure-dose sensitivity, line-width roughness (LWR), and resolution. Fundamental studies are required to quantify the trade-offs in materials properties and

Evaluation of the 3D Compositional Fluctuation Effect on Line-Edge-Roughness

February 25, 2007
Author(s)
Shuhui Kang, Wen-Li Wu, B D. Vogt, Vivek Prabhu, Eric K. Lin, Karen Turnquest
Line-edge-roughness (LER) and the relationship to resist processing and materials design is a critical problem for sub-65 nm photolithography. In this work we investigate how chemical composition fluctuations (heterogeneity) produced by the reaction

FTIR measurements of compositional heterogeneities

February 25, 2007
Author(s)
Shuhui Kang, B D. Vogt, Wen-Li Wu, Vivek Prabhu, David L. VanderHart, Ashwin Rao, Eric K. Lin, Karen Turnquest
A general approach to characterize compositional heterogeneity in polymer thin films using Fourier transform infrared (FTIR) spectroscopy has been demonstrated Polymer films with varying degrees of heterogeneity were prepared using a model chemically

Identifying Materials Limits of Chemically Amplified Photoresists

February 25, 2007
Author(s)
Wen-Li Wu, Vivek Prabhu, Eric K. Lin
Chemically amplified photoresists are likely to remain the primary imaging materials for the semiconductor industry. As feature sizes decrease to dimensions comparable to the characteristic size of the molecules in the photoresist, a significant challenge

Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices

February 25, 2007
Author(s)
Tam H. Duong, David Berning, Allen R. Hefner Jr., Keyue M. Smedley
This paper presents test system developed for long-term stability characterization of 10 kV Silicon Carbide (SiC) power MOSFETs and SiC diodes under 20 kHz hard switching conditions. The system is designed to operate a single power switch and a single

Observation of Quantum Destructive Interference in Inelastic Two-Wave Mixing

February 23, 2007
Author(s)
Kaijun Jiang, Lu Deng, Marvin G. Payne
Using room-temperature 87Rb atoms we demonstrate a quantum destructive interference between two one-photon excitation pathways in an inelastic two-wave mixing scheme that corresponds to the strong-storage and weak-regeneration regime. This destructive

SRM Spotlight (February 2007)

February 23, 2007
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains
Displaying 33151 - 33175 of 74175
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