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Correction of Stray Light In Spectroradiometers and Imaging Instruments

Published

Author(s)

Yuqin Zong, Steven W. Brown, Keith R. Lykke, Yoshihiro Ohno

Abstract

Measurement errors from stray light, spectral or spatial, are inevitable and are often the dominant source of error in spectroradiometers and imaging radiometers/photometers. We have developed a simple matrix method for correcting spatial stray light in imaging instruments as well as spectral stray-light errors in spectrometers. The stray-light correction method is based on the characterization of an instrument for a set of spectral line spread functions (LSF) or a set of point spread functions (PSF) to derive the correction matrix. The correction is simply done by a matrix multiplication to the measured raw signals, and stray-light errors are reduced by one to two orders of magnitude. By using a stray-light-corrected instrument, significant reductions are expected in overall measurement uncertainties in radiometry, colorimetry, photometry and many other applications.
Proceedings Title
Proceedings of the International Commission on Illumination | 26th | 2007 | CIE
Volume
CIE 178:2007
Conference Dates
July 4-11, 2007
Conference Location
Beijing, CH
Conference Title
CIE, International Commission on Illumination

Keywords

imaging istrument, size-of-source effect, spatial stray light, spectral stray light, spectrograph, spectroradiometer, veiling glare

Citation

Zong, Y. , Brown, S. , Lykke, K. and Ohno, Y. (2007), Correction of Stray Light In Spectroradiometers and Imaging Instruments, Proceedings of the International Commission on Illumination | 26th | 2007 | CIE, Beijing, CH, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841072 (Accessed May 18, 2024)

Issues

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Created July 4, 2007, Updated February 19, 2017