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Displaying 33076 - 33100 of 73830

Calibrated Overlay Wafer Standard

January 1, 2007
Author(s)
Michael T. Stocker, Richard M. Silver, Ravikiran Attota, Jay S. Jun
This document describes the physical characteristics of Standard Reference Material SRM 5000, provides guidance for its use in calibrating overlay (OL) tools, and gives information and precautions concerning its care and handling.Standard Reference

Cell Morphology and Migration Linked to Substrate Rigidity

January 1, 2007
Author(s)
Yong Ni, Martin Chiang
A mathematical model, based on thermodynamics, was developed to demonstrate the substrate mechanics influences the cell morphology and migration. The mechanisms by which substrate rigidity are translated into cell morphological changes and cell movement

Combinatorial screening of the effect of temperature on the microstructure and mobility of a high performance polythiophene semiconductor

January 1, 2007
Author(s)
Leah A. Lucas, Dean M. DeLongchamp, Brandon M. Vogel, Eric K. Lin, Michael J. Fasolka, Daniel A. Fischer, Iain McCulloch, Martin Heeney, Ghassan Jabbour
Using a gradient combinatorial approach, the authors report the effects of temperature on the microstructure and hole mobility of poly2,5-bis3-dodecylthiophen-2ylthieno3,2-bthiophene thin films for application in organic field-effect transistors. The

Comments on 'Bayesian evaluation of comparison data' by Ignacio Lira

January 1, 2007
Author(s)
Raghu N. Kacker, Blaza Toman
A recent paper by Ignacio Lira in Metrologia 43 (2006) S231-S234 addresses a well-known problem in combining information from interlaboratory evaluations. Lira presents an expression, which he claims to be the kernel of a Bayesian posterior probability

Comparison of Optical and Stylus Methods for Measurement of Rough Surfaces

January 1, 2007
Author(s)
Theodore V. Vorburger, H G. Rhee, Thomas B. Renegar, Jun-Feng Song, Xiaoyu A. Zheng
Abstract Optical methods are increasingly used for measurement of surface texture, particularly for areal measurements where the optical methods are generally faster. A new Working Group under Technical Committee (TC) 213 in the International Organization

Complex permittivity measurements of planar building materials using a UWB free-field antenna measurement system

January 1, 2007
Author(s)
Ben N. Davis, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, James R. Baker-Jarvis, Michael D. Janezic
Building materials are often incorporated into complex, multi-layer macrostructures that are simply not amenable to measurements using coax or waveguide sample holders. In response to this, an ultra-wideband free-field measurement system has been developed
Displaying 33076 - 33100 of 73830
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