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Complex Permittivity Measurements at Millimeter Wave Frequencies

Published

Author(s)

Billy F. Riddle, Michael D. Janezic

Abstract

Contemporary circuit designers are requiring larger bandwidths from microsystems to accomodate the ever-increasing demand for denser content. The electrical performance of these microsystems is intrisically related to the electromagnetic properties of the materials. Methods using the Fabry-Perot resonator (FPR) have found widespread use in systems developed for measuring material properties at millimeter wave frequencies. This paper will provide a brief overview of the theory and methodology of Fabry-Perot resonators and present measurements of selected materials made with the FPR system currently in use at the National Institute of Standards and Technology (NIST).
Conference Dates
April 23-26, 2007
Conference Location
Denver, CO, USA
Conference Title
IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies

Keywords

complex permittivity, Fabry-Perot resonator, millimeter waves

Citation

Riddle, B. and Janezic, M. (2007), Complex Permittivity Measurements at Millimeter Wave Frequencies, IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, Denver, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32619 (Accessed April 24, 2024)
Created April 22, 2007, Updated October 12, 2021