Woicik, J.
, Shirley, E.
, Hellberg, C.
, Sambasivan, S.
, Fischer, D.
, Chapman, B.
, Stern, E.
, Ryan, P.
, Ederer, D.
and Li, H.
(2007),
Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851002
(Accessed October 10, 2025)
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Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations
Published
Author(s)
, , C S. Hellberg, S Sambasivan, , B D. Chapman, E A. Stern, P Ryan, D L. Ederer, H Li
Abstract
Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth. Comparisons with first-principles calculations support this conclusion.Citation
Physical Review Letters
Volume
89
Pub Type
Journals
Download Paper
Keywords
ferroelectric (FE) distortion, lattice constants, perovskites, SrTiO3
Citation
Issues
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Created April 23, 2007, Updated February 19, 2017