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Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations

Published

Author(s)

Joseph C. Woicik, Eric L. Shirley, C S. Hellberg, S Sambasivan, Daniel A. Fischer, B D. Chapman, E A. Stern, P Ryan, D L. Ederer, H Li

Abstract

Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth. Comparisons with first-principles calculations support this conclusion.
Citation
Physical Review Letters
Volume
89

Keywords

ferroelectric (FE) distortion, lattice constants, perovskites, SrTiO3

Citation

Woicik, J. , Shirley, E. , Hellberg, C. , Sambasivan, S. , Fischer, D. , Chapman, B. , Stern, E. , Ryan, P. , Ederer, D. and Li, H. (2007), Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851002 (Accessed March 4, 2024)
Created April 23, 2007, Updated February 19, 2017