Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

X-Ray Induced Fluorescence Measurement of Segregation in a DyI3 Metal-Halide Lamp

Published

Author(s)

T Nimalisuriya, John J. Curry, Craig J. Sansonetti, E J. Ridderhof, S Shastri, A J. Flikweert, W W. Stoffels, M Haverlag, J J. van der Mullen

Abstract

X-ray induced fluorescence measurements, using high energy synchrotron radiation generated on the Sector 1 Insertion Device beamline at the Advanced Photon Source, were performed on a metal-halide lamp containing Hg and DyI$_3}$. Density distributions of Dy show significant axial and radial segregation. Density distributions of I show little axial and radial segregation, a surplus of I is formed in the discharge as Dy forms Dy silicates at the wall of the lamp burner. Axial segregation is quantified using the Fischer axial segregation parameter $\lambda$. For Dy $\lambda = 0.215 \pm 0.002$ mm$^-1}$, this is in agreement with $\lambda$ found with a laser absorptionmethod \citeFlikweert05}. The $\lambda$ value for Iodine was found to be four times smaller. From the Hg density distribution a temperature profile was constructed, using a wall temperature measurement for calibration.
Citation
Journal of Physics D-Applied Physics
Volume
40

Keywords

dysprosium, lighting, plasma, spectroscopy, x-ray

Citation

Nimalisuriya, T. , Curry, J. , Sansonetti, C. , Ridderhof, E. , Shastri, S. , Flikweert, A. , Stoffels, W. , Haverlag, M. and van der Mullen, J. (2007), X-Ray Induced Fluorescence Measurement of Segregation in a DyI3 Metal-Halide Lamp, Journal of Physics D-Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840863 (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 18, 2007, Updated October 12, 2021