January 1, 2008
      
                  
        
  Author(s)
  David T. Read,   Walter  Gerstle,   Stewart  Silling,   Vinod K. Tewary,   Richard  Lehoucq
 
       
            
    
    
        A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat