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Search Publications

NIST Authors in Bold

Displaying 28276 - 28300 of 73697

Molar Mass and Related Quantities in the New SI

June 3, 2009
Author(s)
Barry N. Taylor
This Letter addresses the calculation of molar mass and related quantities in the New SI currently under discussion by the International Committee for Weights and Measures and its Consultative Committee for Units and which could be adopted by the next

Tapered Transmission Lines with Dissipative Junctions

June 3, 2009
Author(s)
Paul D. Dresselhaus, Mike Elsbury, Samuel P. Benz
NIST is optimizing the design of a 10 V programmable Josephson voltage standard so that it uses less microwave power by use of fewer parallel-biased arrays with higher voltage per array. Increasing the voltage per array by adding more junctions is

Absolute Flux Calibration of Stars; Calibration of the Reference Telescope

June 2, 2009
Author(s)
Allan W. Smith, John T. Woodward IV, Colleen A. Jenkins, Steven W. Brown, Keith R. Lykke
Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega with instruments calibrated using the Planckian radiance from a Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30

An Automated Video-Based System For Iris Recognition

June 2, 2009
Author(s)
Yooyoung Lee, P. Jonathon Phillips, Ross J. Micheals
We have successfully implemented a Video-based Automated System for Iris Recognition (VASIR), evaluating its successful performance on the MBGC dataset. The proposed method facilitates the ultimate goal of automatically detecting an eye area, extracting

CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm

June 2, 2009
Author(s)
Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E. Gibson, Howard Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Five

Determination of the Electron Escape Depth for NEXAFS Spectroscopy

June 2, 2009
Author(s)
Daniel A. Fischer, K E. Sohn, M D. Dimitriou, Jan Genzer, C Hawker, E. J. Kramer
Depth profiling using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy was used to determine the carbon atom density as a function of depth by analyzing the post-edge signal in NEXAFS spectra. We show that the common assumption in the

Supercontinuum Sources for Metrology

June 2, 2009
Author(s)
John T. Woodward IV, Allan W. Smith, Colleen A. Jenkins, Chungsan Lin, Steven W. Brown, Keith R. Lykke
Supercontinuum (SC) sources are novel laser-based sources that generate a broad, white-light continuum in single mode photonic crystal fibers. Currently, up to 6 W of optical power is available, spanning the spectral range from 460 nm to 2500 nm. Advances

AIR-BRIDGE INTEGRATED STUB FILTER FOR SUB-MILLIMETER WAVE APPLICATIONS

June 1, 2009
Author(s)
Dazhen Gu, Fernando Rodriquez-Morales, Sigfrid Yngvesson
We report a coplanar waveguide notch filter with an integrated air-bridge, designed for operation at sub-millimeter wave frequencies and cryogenic temperatures. The filter is built with a planar slot- ring antenna, which is in turn loaded with a su

Application of the Josephson effect in electrical metrology

June 1, 2009
Author(s)
Samuel P. Benz, Blaise Jeanneret
Over the last 30 years, metrology laboratories have used the quantum behavior of the Josephson effect to greatly improve voltage metrology. The following article reviews the history and present status of the research and development Josephson voltage

Characterization of a Metafilm/Metasurface

June 1, 2009
Author(s)
Christopher L. Holloway, Andrew M. Dienstfrey, Edward E. Kuester
A metafilm (also referred to as a metasurface) is the surface equivalent of a metamaterial. More precisely, a metafilm is a surface distribution of suitably chosen electrically-small scatterers. Metafilms are becoming popular as an alternative to full

Computer-Generated Hologram Cavity Interferometry Test for Large X-Ray Mandrels: Design

June 1, 2009
Author(s)
Guangjun Gao, John P. Lehan, William W. Zhang, Ulf Griesmann, Johannes A. Soons
A glancing incidence interferometric test for large x-ray mirror mandrels, using two computer generated holograms (CGH s), is described. The two CGH s are used to form a double pass glancing incidence system. One layout of the CGH-cavity glancing incidence

Design and Performance of the New NIST Hybrid Humidity Generator

June 1, 2009
Author(s)
Christopher W. Meyer, W Wyatt Miller, Dean C. Ripple, Gregory E. Scace
A new humidity generator has been constructed at the National Institute of Standards and Technology and is now fully operational. The NIST Hybrid Humidity Generator (HHG) has replaced the Two-Pressure (2-P) Humidity Generator Mark II as the NIST primary

Development and Demonstration of a Method to Evaluate Bio-Sampling Strategies using Building Simulation and Sample Planning Software

June 1, 2009
Author(s)
William S. Dols, Jayne B. Morrow, Andrew K. Persily, Brett Matzke, Landon Sego, Lisa Nuffer, Brent Pulsipher
In an effort to validate and demonstrate response and recovery sampling approaches and technologies, the U.S. Department of Homeland Security (DHS), along with several other agencies, have simulated a bio-terrorist release within a facility at Idaho

Effect of Dissolved Nitrogen Gas on the Density of Di-2-Ethylhexyl Sebacate: Working Fluid of the NIST Oil Ultrasonic Interferometer Manometer Pressure Standard

June 1, 2009
Author(s)
Jay H. Hendricks, Jacob R. Ricker, Justin H. Chow, Douglas A. Olson
The National Institute of Standards and Technology (NIST) Low Pressure Manometry Laboratory maintains national pressure standards ranging from 1 mPa to 360 kPa through the operation of four ultrasonic interferometer manometer (UIM) pressure standards. NIST

Experimental Study of High Speed Polarization -Coding Quantum Key Distribution with Sifted -Key Rates Over Mbit/s

June 1, 2009
Author(s)
Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Barry J. Hershman, Joshua C. Bienfang, David H. Su, Ronald F. Boisvert, Charles W. Clark, Carl J. Williams
We have demonstrated a polarization encoded, fiber-based quantum key distribution system operating at 850 nm in the B92 protocol. With a quantum bit transmission rate i.e. optical pulse driving frequency of 625 MHz and a mean photon number of 0.1, we
Displaying 28276 - 28300 of 73697
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