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Characterization of Uncertainties When Measuring Metal Cutting Temperatures Using Infrared Radiation Thermography

Published

Author(s)

Eric P. Whitenton

Abstract

There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal cutting. It is important to understand how these error sources affect the measurement uncertainty. Some are familiar to anyone performing thermography measurements, such as uncertainties in the basic camera calibration. However, metal cutting presents unique measurement challenges due to factors such as the high magnification required, high surface speeds, polarization effects, micro-blackbody effects, and changing emissivity as chips form. This paper presents highlights of the current state of our efforts to catalog and characterize error sources and resulting uncertainties.
Proceedings Title
SPIE Defense, Security, and Sensing 2009 Conference - Thermosense XXXI
Volume
7299
Conference Dates
April 13-17, 2009
Conference Location
Orlando, FL

Keywords

uncertainty, metal cutting, dual spectrum, high speed imaging

Citation

Whitenton, E. (2009), Characterization of Uncertainties When Measuring Metal Cutting Temperatures Using Infrared Radiation Thermography, SPIE Defense, Security, and Sensing 2009 Conference - Thermosense XXXI, Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901490 (Accessed May 26, 2024)

Issues

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Created June 1, 2009, Updated February 19, 2017