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NIST Authors in Bold

Displaying 27651 - 27675 of 73697

NBTI: Why Won't This Thing Go Away?

October 19, 2009
Author(s)
Jason P. Campbell
The negative-bias temperature instability (NBTI) is a reliability problem that, in the last ten years, has risen from relative obscurity to become the most important reliability problem in advanced pMOSFET devices. Even though a significant effort has been

Optical Properties of Semiconductors

October 19, 2009
Author(s)
David G. Seiler, Stefan Zollner, Alain C. Diebold, Paul Amirtharaj
Rapid advances in semiconductor manufacturing and associated technologies have increased the need for optical characterization techniques for materials analysis and in-situ monitoring/control applications. Optical measurements have many unique and

TRC Thermodynamic Tables, Hydrocarbon Supplement H-138

October 19, 2009
Author(s)
Michael D. Frenkel
1. Table 23-14-2-(33.35100)-d/Page d-8950: New table for benzothiophenes, C8 to C12, containing density for the condensed phase at one bar, or at equilibrium vapor pressure above the boiling point. 2. Table 23-2-(5.12006)-db/Pages db-2620.0 to 2620.10: New

Fire Spread and Growth on Flexible Polyurethane Foam

October 18, 2009
Author(s)
William M. Pitts, Gregory Hasapis, Patrick Macatangga
A series of experiments designed to characterize fire spread and growth on flat samples of commercial non-fire-retarded flexible polyurethane foam have been performed. 1.2 m × 1.2 m square sections of foam were ignited along one edge, and the fire spread

Fast Iterative Solver for Convection-Diffusion Systems with Spectral Elements

October 16, 2009
Author(s)
Aaron Lott, Howard Elman
We introduce a solver and preconditioning technique based on Domain Decomposition and the Fast Diagonalization Method that can be applied to tensor product based discretizations of the steady convection-diffusion equation. The method is based on iterative

Wafer-level Hall Measurement on SiC MOSFET

October 16, 2009
Author(s)
Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng
Low channel mobility is one of the biggest challenges to commercializing SiC MOSFETs. Accurate mobility measurement is essential for understanding the mechanisms that lead to low mobility. The most widely used effective mobility measurements overestimate

Benefits and Costs of Research: A Case Study of Improved Service Life Prediction

October 15, 2009
Author(s)
Robert E. Chapman, David T. Butry, Allison L. Huang, Douglas S. Thomas
This report focuses on a critical analysis of the economic impacts of research conducted by BFRL s Service Life Prediction (SLP) Program for High-Performance Polymeric Construction Materials. The SLP Program is an interdisciplinary research effort within

Fabrication with Flip-Chip Lamination

October 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.

HYDRATED PHASES IN BLENDED CEMENTITIOUS SYSTEMS FOR NUCLEAR INFRASTRUCTURE

October 15, 2009
Author(s)
Kenneth A. Snyder, Paul E. Stutzman, Jacob Philip, David W. Esh
The hydration products of varying proportions of portland cement, fly ash, ground granulated blast furnace slag, and silica fume in blended systems were identified and quantified. The proportion of portland cement varied from 100 % down to 10 %. The

Temperature dependence of spin-torque-driven self-oscillators

October 15, 2009
Author(s)
William H. Rippard, Matthew R. Pufall, Thomas Cecil, Thomas J. Silva, Stephen E. Russek, M. L. Schneider
We have measured the temperature dependence of spin-torque-driven self-oscillations in point-contact nanooscillators for both in-plane and out-of-plane applied fields. We find that the linewidth for both field geometries is qualitatively similar. In the

An Analysis of CVSS Version 2 Vulnerability Scoring

October 14, 2009
Author(s)
Karen A. Scarfone, Peter M. Mell
The Common Vulnerability Scoring System (CVSS) is a specification that is used to measure the relative severity of software vulnerabilities. CVSS version 2, which was finalized in June 2007, was designed to address several deficiencies discovered during

Ground Truth Data Using 3D Imaging for Urban Search and Rescue Robots

October 14, 2009
Author(s)
Nicholas A. Scott, Alan M. Lytle
The National Institute of Standards and Technology (NIST) is leading an effort to develop performance standards for ur- ban search and rescue robots (US&R). An important com- ponent of developing performance standards for these robots is capturing ground

Mobile Forensic Reference Materials: a Methodology and Reification

October 14, 2009
Author(s)
Wayne Jansen, Aurelien M. Delaitre
This report concerns the theoretical and practical issues with automatically populating mobile devices with reference test data for use as reference materials in validation of forensic tools. It describes an application and data set developed to populate

October 2009 SRM Spotlight

October 14, 2009
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Simplified Analysis of Matcher Performance and Fusion

October 14, 2009
Author(s)
Vladimir N. Dvornychenko
Provides some first-order techniques for analyzing matcher performance. A novel argument is used to derive the power-law as a kind of baseline for analyzing matcher performance. The power-law is then applied to two situations: a) CMC curves, and b) fusion
Displaying 27651 - 27675 of 73697
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