Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 276 - 300 of 1513

Experiments to Test the A-UGV Capabilities Standard

December 8, 2021
Author(s)
Soocheol Yoon, Roger V. Bostelman, Ann Virts
Automatic, Automated, or Autonomous - Unmanned Ground Vehicles (A-UGVs), as referred to by ASTM International Committee F45, are industrial vehicles that have capabilities to navigate, dock, avoid obstacles, and interact with other vehicles and systems all

Towards community-driven metadata standards for light microscopy: tiered guidelines extending the OME model

December 1, 2021
Author(s)
Peter Bajcsy, Mathias Hammer, Maximiliaan Huisman, Alex Rigano, Ulrike Boehm, James J. Chambers, Nathalie Gaudreault, Jaime A. Pimentel, Damir Sudar, Claire M. Brown, Alexander D. Corbett, Orestis Faklaris, Judith Lacoste, Alex Laude, Glyn Nelson, Roland Nitschke, Alison J. North, Renu Gopinathan, Farzin Farzam, Carlas Smith, David Grunwald, Caterina Strambio-De-Castillia
While the power of modern microscopy techniques is undeniable, rigorous record-keeping and quality control are required to ensure that imaging data may be properly interpreted (quality), reproduced (reproducibility), and used to extract reliable

NUScon: A community-driven platform for quantitative evaluation of nonuniform sampling in NMR

November 25, 2021
Author(s)
Yulia Pustovalova, Frank Delaglio, Darien Craft, Hari Arthanari, Ad Bax, Martin Billeter, Mark Bostock, Hesam Dashti, Flemming Hansen, Sven Hyberts, Bruce Johnson, Krzysztof Kazimierczuk, Hengfa Lu, Mark W. Maciejewski, Tomas Miljenovic, Mehdi Mobli, Daniel Nietlispach, Vladislav Orekhov, Robert Powers, Xiaobo Qu, Scott Robson, David Rovnyak, Gerhard Wagner, Jinfa Ying, Matthew Zambrello, Jeffrey C. Hoch, David Donoho, Adam D. Schuyler
Although the concepts of non-uniform sampling (NUS) and non-Fourier spectral reconstruction in multidimensional NMR began to emerge four decades ago (Bodenhausen and Ernst, 1981; Barna and Laue, 1987), it is only relatively recently that NUS has become

A Comparison of Particle Size Distribution and Morphology Data acquired using Lab-based and Commercially Available Techniques: Application to Stainless Steel Powder

November 17, 2021
Author(s)
Justin Whiting, Edward Garboczi, Vipin Tondare, John Henry J. Scott, Alkan Donmez, Shawn P. Moylan
The particle size distribution (PSD) and particlemorphology ofmetal powders undoubtedly affects the quality of parts produced by additivemanufacturing (AM). It is, therefore, crucial to accurately knowthe PSD and morphology of these powders. There exist

Electro-optically derived millimeter-wave sources with phase and amplitude control

October 12, 2021
Author(s)
Bryan Bosworth, Nick Jungwirth, Kassi Smith, Jerome Cheron, Franklyn Quinlan, Ari Feldman, Dylan Williams, Nate Orloff, Chris Long
Integrated circuits are building blocks in millimeter-wave handsets and base stations, requiring nonlinear characterization to optimize performance and energy efficiency. Today's sources use digital-to-analog converters to synthesize arbitrary electrical

Encryption is Futile: Reconstructing 3D-Printed Models using the Power Side-Channel

October 6, 2021
Author(s)
Jacob Gatlin, Sofia Belikovetsky, Yuval Elovici, Anthony Skjellum, Joshua Lubell, Paul Witherell, Mark Yampolskiy
Outsourced Additive Manufacturing (AM) exposes sensitive design data to external malicious actors. Even with end-to-end encryption between the design owner and 3D-printer, side-channel attacks can be used to bypass cyber-security measures and obtain the
Displaying 276 - 300 of 1513
Was this page helpful?