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Displaying 26551 - 26575 of 74142

Improving the NIST High-Performance ICP-OES Methodology through Exact Matching

August 26, 2010
Author(s)
Michael R. Winchester, Therese A. Butler, Gregory C. Turk
High-Performance” (HP-)ICP-OES was developed at the National Institute of Standards and Technology (NIST) approximately a decade ago as a means of performing ICP OES analyses with relative expanded uncertainty on the order of 0.2 %, expressed at a level of

Microfabricated High-Moment Micrometer-Sized MRI Contrast Agents

August 26, 2010
Author(s)
Gary Zabow, John M. Moreland, Stephen Dodd, alan koretsky, erik shapiro
While chemically synthesized superparamagnetic microparticles have enabled much new research based on MRI tracking of magnetically labeled cells, signal-to-noise levels still limit the potential range of applications. Here it is shown how, through top-down

Design Considerations for Proteomic Reference Materials

August 25, 2010
Author(s)
David M. Bunk
In order to improve the repeatability, comparability, and accuracy of proteomic measurements, there has been considerable international effort to develop appropriate reference materials. While the majority of reference materials are developed to support

Measurement Needs in Sustainability and Materials Performance

August 24, 2010
Author(s)
Richard E. Ricker
Sustainability is an attractive approach to environmental stewardship because it recognizes the importance of continued profitability in maintaining the environment and advancing society. However, the ability of this approach to actually provide benefit

Temperature dependence of the diffusive conductivity of bilayer graphene

August 24, 2010
Author(s)
Shaffique Adam, Mark D. Stiles
Assuming diffusive carrier transport and employing an effective medium theory, we calculate the temperature dependence of bilayer graphene conductivity due to Fermi-surface broadening as a function of carrier density. We find that the temperature

Practical Near-Collisions for Reduced Round Blake, Fugue, Hamsi and JH

August 23, 2010
Author(s)
Meltem Sonmez Turan, Erdener Uyan
A hash function is near-collision resistant, if it is hard to find two messages with hash values that differ in only small number of bits. In this study, we used hill climbing methods to find near-collisions for some of the second round SHA-3 candidates

yocto-Newton force detection sensitivity using trapped ions

August 22, 2010
Author(s)
Michael J. Biercuk, Joseph W. Britton, Hermann Uys, Aaron Vandevender, John Bollinger
Recent experimental advances have shown that it is possible to detect forces arising from electric fields at a level of aN/ √Hz (atto = 10 -18 through coupling of micro or nanofabricated mechanical resonators to a variety of physical systems including

PHOTOPOLYMERIZED DIMETHACRYLATE POLYMERS CONTAINING IN SITU GENERATED SILVER NANOPARTICLES

August 21, 2010
Author(s)
Yajun Cheng, Xinran Zhang, Diana N. Zeiger, Nancy Lin, Joseph M. Antonucci, Sheng Lin-Gibson
Polymeric nanocomposites containing silver are known to exhibit antibacterial activity. Here we demonstrate the synthesis and characterization of dimethacrylate/silver nanocomposites by coupling photopolymerization with in situ silver ion reduction. An

Cryogenic Fourier Transform Infrared Spectrometer from 4 to 20 Micrometers

August 20, 2010
Author(s)
Simon G. Kaplan, Solomon I. Woods, Timothy M. Jung, Adriaan C. Carter
We describe the design and performance of a cryogenic Fourier transform spectrometer (Cryo-FTS) operating at a temperature of approximately 15 K. The instrument is based on a porch-swing scanning mirror design with active alignment stabilization using a

Image specific error rate: A biometric performance metric

August 20, 2010
Author(s)
Elham Tabassi
Image-specific false match and false non-match error rates are defined by inheriting concepts from the biometric zoo. These metrics support failure mode analyses by allowing association of a covariate (e.g., dilation for iris recognition) with a matching

AFM characterization of nanopositioner in-plane stiffnesses

August 19, 2010
Author(s)
Seung Ho Yang, Yong Sik Kim, Premsagar P. Kavuri, Jae M. Yoo, Young M. Choi, Nicholas G. Dagalakis
A versatile method for measurement of in-plane stiffness of micro-elements was developed and its usefulness has been demonstrated. The in-plane stiffness of a NIST nanopositioner has been measured directly using a colloidal probe in an AFM without any

NEW Scanning Electron Microscope Magnification Calibration Reference Material (RM) 8820

August 19, 2010
Author(s)
Michael T. Postek, Andras Vladar, William J. Keery, Michael Bishop, Benjamin Bunday, John Allgair
Reference Material 8820 (RM 8820) is a new scanning electron microscope calibration reference material for nanotechnology and nanomanufacturingtion recently released by NIST. This standard was developed to be used primarily for X and Y scale (or
Displaying 26551 - 26575 of 74142
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