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Displaying 1601 - 1625 of 1947

Vibration-induced PM noise measurements of a rigid optical fiber spool

May 19, 2008
Author(s)
Jennifer A. Taylor, Craig W. Nelson, Archita Hati, Neil Ashby, David A. Howe
The opto-electronic oscillator (OEO) has emerged in recent years as an excellent low-noise source that rivals the best RF oscillators over broad offset frequencies. The main sources of noise in an OEO are the laser and RF modulator, photo detector, loop

Reference Material for Assessing Forensic SIM Tools

October 1, 2007
Author(s)
Wayne Jansen, Aurelien M. Delaitre
Subscriber Identity Modules (SIMs) are a fundamental standardized component of most cell phones used worldwide. A SIM can be removed from a phone handset and inserted into another, allowing users to port identity, personal information, and service between

Spin Torque for Dummies

January 6, 2007
Author(s)
Thomas J. Silva
I will present a stripped down presentation on the fundamental mechanisms that give rise to spin torque effects. This presentation will assume the audience has little or no background in this fascinating and rapidly expanding field. We will start with an

Simple Spectral Stray Light Correction Method for Array Spectroradiometers

February 20, 2006
Author(s)
Yuqin Zong, Steven W. Brown, Bettye C. Johnson, Keith R. Lykke, Yoshihiro Ohno
In many applications, the measurement accuracy of spectroradiometers, particularly instruments with a single dispersive element, is limited by the presence of stray radiation within the instrument. A simple, practical method has been developed to correct a

Electrodeposition of Cu on Ru Barrier Layers for Damascene Processing

December 2, 2005
Author(s)
Thomas P. Moffat, Marlon L. Walker, P J. Chen, John E. Bonevich, William F. Egelhoff Jr., Lee J. Richter, Daniel Josell, C A. Witt, T Aaltonen, M Ritala, M Leskela
Superfilling of sub-micrometer trenches by direct copper electrodeposition onto PVD and ALD Ru barriers is demonstrated. The Cu nucleation and growth mode is found to be sensitive to the oxidation state of the Ru surface as well as the copper deposition

Packaging of In-Plane Micro-Actuators for BioMEMS Applications

November 5, 2005
Author(s)
Hrishikesh V. Panchawagh, David Serrell, Faheem F. Faheem, Cari F. Herrmann, Dudley Finch, Roop L. Mahajan
Two issues related to actuation of in-plane, electro-thermal actuators for BioMEMS applications are addressed. First, a packaging solution to protect the actuator from biological debris and particulates by encapsulating the actuator with a cap using flip

Interoperable Dynamic Tactical Information for Public Safety Officials

January 23, 2004
Author(s)
William D. Davis, D D. Evans
Currently, fire department notification of a building fire comes from either a building fire alarm system monitoring service or a 911 call. The emergency responders know very little about the situation until they arrive on the scene. Information for their

X-Ray Spectroscopy and Calibrations in the 50 eV to 60 keV Range

July 11, 2002
Author(s)
J Seely, Lawrence T. Hudson, J. Weaver, G Holland, C N. Boyer
Spectrometers have been developed to record x-ray spectra in the energy range 50 eV to 60 keV. The dispersion elements are transmission crystals for energies higher than approximately 10 keV, reflection crystals for 1 keV to 20 keV and transmission

Isochoric Heat Capacity Measurements for Heavy Water Near the Critical Point

May 1, 2002
Author(s)
N. G. Polikhronidi, I M. Abdulagatov, Joe W. Magee, G. V. Stepanov
Isochoric heat capacity measurements of D 20 are presented as a function of temperature at fixed densities of 319.60, 398.90, 431.09 and 506.95 kg m -3. The measurements cover a range of temperatures from 551 to 671 K and pressures up to 32 Mpa. The

Moving the Pulsed Heating Technique Beyond Monolithic Specimens: Experiments with Coated Wires

August 1, 2001
Author(s)
Daniel Josell, D Basak, J L. McClure, Ursula R. Kattner, Maureen E. Williams, William J. Boettinger, M Rappaz
Pulsed heating experiments based on pyrometric measurement of the temperature-time history of metal specimens rapidly heated by passage of electric current have a thirty year history at NIST. In recent years, efforts have been made to move beyond the

New Certified Length Scale for Microfabrication Metrology

September 1, 1996
Author(s)
James E. Potzick
The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 micrometers to 10 mm, intended for the calibration of microscope magnification and of dimensional metrology instrument scales. Called SRM

Measured Performance of Building Inegrated Photovoltaic Panels - Round 2

August 1, 2005
Author(s)
Brian P. Dougherty, Arthur H. Fanney, Mark W. Davis
Architects, building designers, and building owners presently lack sufficient resources for thoroughly evaluating the economic impact of building integrated photovoltaics (BIPV). The National Institute of Standards and Technology (NIST) is addressing this
Displaying 1601 - 1625 of 1947
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