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Search Publications

NIST Authors in Bold

Displaying 9951 - 9975 of 13225

Composite Substrate Research for Large-format HgCdTe IRFPAs

April 1, 2003
Author(s)
N. K. Dhar, Y Chen, P M. Brill, Paul M. Amirtharaj, S Velicu, P Boieriu, Anthony G. Birdwell
… better surface morphology and control of composition. In this work we present our results on the Si-based substrate technology and its application in the use of substrate materails for LWIR HgCdTe detector …

Data Quality Assurance for Thermophysical Property Databases - Applications to the TRC Source Data Warehouse

October 1, 2002
Author(s)
Qian Dong, Xinjian Yan, R C. Wilhoit, X Hong, Robert D. Chirico, Vladimir Diky, Michael D. Frenkel
… are susceptible to various errors. Propagation of errors in the processing leads to a decrease in the value of original data as well as that of the many … rules was established through the use of moderndatabase technology, statistical methods, and thermodynamic …

A Simulation Framework for Evaluating Mobile Robots

August 15, 2002
Author(s)
Stephen B. Balakirsky, Elena R. Messina
… to heterogeneous groups of systems that operate in complex non-structured environments. The novel and … experimentation are no longer sufficient. To assist in evaluating these components and making design decisions, …

Characterization of a Controlled-Clearance Piston Gauge Using the Heydemann-Welch Model

August 1, 2002
Author(s)
T Kobata, James W. Schmidt, Douglas A. Olson
… was performed at the National Institute of Standards and Technology (NIST). The characterization covers the pressure … 37.5 MPa to 288 MPa, at jacket pressures up to 76 MPa. In this study, the Heydemann-Welch model was used to define … of the characterization and calibration are described in this paper. …

Linking Sensed Images to an Ontology of Obstacles to Aid in Autonomous Driving

August 1, 2002
Author(s)
Craig I. Schlenoff
… In this paper, we discuss the importance of recognizing and … these representation to an ontology of obstacles to aid in deducing additional information about them. With the … recently-begun at the National Institute of Standards and Technology in developing and incorporating an ontology of …

Compact Force Sensors for Low-Force Mechanical Probe Calibration

June 1, 2002
Author(s)
Douglas T. Smith, S Woody, Jon R. Pratt
… machines are often calibrated using deadweights. In many cases, due to the geometry of the loading frame, the … the indentation leads to be measured are compressive. In this paper, we report preliminary efforts to develop a … (fabricated at the National Instititue of Standards and Technology), the other a piezoresistive force sensor. We will …

Colorimetric Characterization of Pearlescent Coatings

January 1, 2002
Author(s)
Maria E. Nadal, Thomas A. Germer
… developments at the National Institution of Standards and Technology in the colorimetric characterization of pearlescent coatings. … samples, where the pearl coat and basecoat are different in color, have been measured for the visible region at …

Luminous Intensity of LEDs at NIST

October 1, 2001
Author(s)
Carl C. Miller, Yoshihiro Ohno
… been developed at the National Institute of Standards and Technology (NIST). The scale has been established on two … as well as for the calibration of LEDs are analyzed in detail. Calibration services are now available for …

Adjusting the Values of the Fundamental Constents

March 1, 2001
Author(s)
Peter J. Mohr, Barry N. Taylor
… In order to compare theoretical predictions to experimental measurements in many basic studies and applications of physics, it is … volt and the joule. Many other fields of science and technology require values of the constants as well. For such …

Highly Charged Ions

January 1, 2001
Author(s)
John D. Gillaspy
… and their use as a tool for both basic science and applied technology. Topics discussed include: charge-dependence and … Stark effect, line intensities, linewidths, etc.), changes in angular momentum coupling schemes, selection rules, …

Internet-based Distributed Measurement and Control Applications

June 1, 1999
Author(s)
Kang B. Lee, Richard D. Schneeman
… work conducted at the National Institute of Standards and Technology (NIST) on an Internet-based Distributed … and Control (DMC) system. The work has resulted in applications that highlight state-of-the-art hardware and …

IEEE Trans on Instrumentation - Forward

April 1, 1999
Author(s)
Norman B. Belecki
… The National Institute of Standards and Technology hosted the 1998 Conference on Precision Electromagnetic Measurements (CPEM'98) in Washington, D.C. during the week of July 6-10, 1998. … around the world, for discussions on the latest advances in standards, instrumentation, measurement techniques, and …

Spectroscopic Ellipsometry: In Situ Monitor and Control of III-V Semiconductors Grown by Molecular Beam Epitaxy

February 19, 1999
Author(s)
Donald A. Gajewski, Jonathan E. Guyer, Joseph G. Pellegrino
… the physical properties of thin film III-V semiconductors, in situ and in real time during film growth. I will present SE … epilayers on GaAs. These measurements have application in monitoring and controlling the composition and thickness … Spectroscopic Ellipsometry: In Situ Monitor and Control of III-V Semiconductors Grown by …

Gapped Arresters Revisited: A Solution to Cascade Coordination

October 1, 1998
Author(s)
A. Mansoor, Francois D. Martzloff, K. O. Phipps
… an issue. We propose an approach where the 'ancient' technology of gapped arresters may well be the answer to the … high limiting voltage with the proliferation of built-in or plug-in SPDs having relatively low limiting voltage inside the …

SGML on the WEB: A Tale of Two Sites

December 1, 1997
Author(s)
Joshua Lubell
… (Hyper-Text Markup Language) offers no help whatsoever in managing the information on their web sites. SGML … Language) provides the flexibility and reuse lacking in HTML. However, SGML alone does not address the problems … hyperlinked documents, a system combining SGML, database technology, and the protocols of the Web can provide a …

Telecommunications Security Guidelines for Telecommunications Management Network

October 2, 1995
Author(s)
John Kimmins, Charles Dinkel, Dale Walters
… Devices (MDs) that is based on commercial security needs. In addition, some National Security and Emergency … The guideline should assist telecommunications vendors in developing systems and service providers in implementing … standards of the National Institute of Standards and Technology. …
Displaying 9951 - 9975 of 13225
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