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NIST Authors in Bold

Displaying 6476 - 6500 of 13218

An Enabler for Supplier Discovery in Virtual Supply Chains: A Shared Terminology

November 5, 2009
Author(s)
Steven J. Fenves, Eswaran Subrahmanian, Mahesh Mani, Albert T. Jones
… partnerships will develop rapidly by composing global manufacturing resources in response to open market opportunities; and, they will … An Enabler for Supplier Discovery in Virtual Supply Chains: A Shared Terminology …

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

September 19, 2009
Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
… presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from …

Quantitative, Interactive Measurement of Tissue Engineering Scaffold Structure in an Immersive Visualization Environment

October 2, 2006
Author(s)
John G. Hagedorn, Joy P. Dunkers, Adele P. Peskin, John T. Kelso, Lori Henderson, Judith E. Terrill
… the ability to interact directly with data representations in ways that are not possible with desktop systems. … actual scaffolds to the design model and evaluate scaffold manufacturing processes. … Measurement of Tissue Engineering Scaffold Structure in an Immersive Visualization Environment …

Exchanging Technical Product Data, The Story of ISO TC 184/SC4

June 1, 2005
Author(s)
Sharon J. Kemmerer
… historically as multiple, and isolated, national efforts in the 1970s and early 80s. The industrial domain leading the way in the 70s was primarily the transportation sector … to develop a standardized exchange method for product data in an internationally recognized forum --- ISO, the …

Atmospheric Pressure Microplasmas for Modifying Sealed Microfluidic Devices

March 8, 2004
Author(s)
J K. Evju, P B. Howell, Laurie E. Locascio, Michael J. Tarlov, J J. Hickman
… imparted unto the walls of assembled polymer microchannels in atmospheric pressure plasma consisting of helium and … of surface and wetting properties is expected to be useful in the manufacture of microfluidic channels in a variety of substrates. Small area X-ray photoelectron …

Towards Modeling the Evolution of Product Families

June 1, 2003
Author(s)
Fujun Wang, Steven J. Fenves, Sudarsan Rachuri, Ram D. Sriram
… A strategy successfully used by manufacturing companies is to develop product families so as … Product Family, Family Evolution, and Evolution Rationale. In addition, an Unified Modeling Language (UML)-based … Proceedings of CIE03 2003 ASME Computers and Information in Engineering Conference …

NORAMET Comparison of Gauge Block Measurement by Optical Interferometry

October 1, 1999
Author(s)
Jennifer Decker, A Lapointe, John R. Stoup, M V. Alonso, J R. Pekelsky
… carbide gauge blocks from 9 manufacturers, ranging in length from 05. mm to 101.6  mm were calibrated by four … of two different techniques with potential for application in the comparison of national metrology institute (NMI) …

Cell Controller Operations Manual

January 1, 1988
Author(s)
Bruce Thomas
… This manual is one in a series of operations manuals written to instruct a novice in the operation of one of the systems in the Automated Manufacturing Research Facility (AMRF) at the National Bureau …

Radio-Frequency Metrology from NBS to NIST, The Legacy

May 1, 2001
Author(s)
Dennis S. Friday
… We review a century of metrology research and development in the U.S. that paralleled the birth of radio/wireless and … programs at the National Institute of Standards and Technology (formerly the National Bureau of Standards (NBS) …

Smart City Standardization: A Global Perspective

November 1, 2025
Author(s)
William Dunaway, Cheyney O'Fallon
… The Global Community Technology Challenge (GCTC) is the smart cities program of the National Institute of Standards and Technology (NIST) in the U.S. Department of Commerce. Since its formation in

PSCR 2020_First Responder IoT Environments: Examining Data Foundations

October 29, 2020
Author(s)
Alison M. Kahn
… of Things (IoT) technologies become more prevalent in society, there is still a large technology gap existing in the public safety field. This … and the Department of Homeland Security (DHS) Science and Technology Directorate to determine a schema for the …

Job Shop Scheduling

May 1, 1996
Author(s)
Albert T. Jones, Luis C. Rabelo, Yuehwern Yih
… of job shop scheduling problems have been reported in the OR literature, with varying degrees of success. These … networks, genetic algorithms, and inductive learning. In this article, we take evolutionary view in describing how … a few of the most important contributions in each of these technology areas are discussed. We close by looking at the …

The TREC Spoken Document Retrieval Track: A Success Story

April 1, 2000
Author(s)
John S. Garofolo, C G. Auzanne, Ellen M. Voorhees
… Text REtrieval Conference (TREC) over the last three years in designing and implementing evaluations of Spoken Document Retrieval (SDR) technology within a broadcast news domain. SDR involves the … infrastructure for the development and evaluation of SDR technology and a common forum for the exchange of knowledge …

Tunnel-Coupled Quantum Dots: Atomistic Theory of Quantum Dot Molecules and Arrays

June 1, 2003
Author(s)
Garnett W. Bryant, Javier Aizpurua, W Jaskolski, M Zielinski
… An understanding of how dots couple in quantum dot molecules and arrays is needed so that the possibilities for tailored nanooptics in these systems can be explored. The properties of … Physics and Technology of Semiconductor Quantum Dots, Symposium E | | Physics and Technology of Semiconductor Quantum Dots | Materials Research …

Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns, Cold Field-Emission SEM/STEM, and Analytical S/TEM

July 25, 2025
Author(s)
Vladimir Oleshko, Glenn Holland, Daron Westly, John Villarrubia
… and dimensional characterization of layered structures in semiconductors is increasingly important for microelectronics manufacturing because of the continuing downward scaling of … and performance. Electron diffraction (ED) techniques in S/TEMs with an incident beam oriented along a lattice …

Exploring Registration of Optical, CMM and XCT for Verification of Supplemental Surfaces to Define AM Lattices: Application to Cylindrical and Spherical Surfaces

August 25, 2021
Author(s)
Maxwell Praniewicz, Jason Fox, Gaurav Ameta, Felix Kim, Paul Witherell, Christopher Saldana
… The use of lattice structures produced using additive manufacturing (AM) is of great interest to the aerospace and … However, their use is often limited due to challenges in qualification. Recent standards proposed for the … structures created using AM attempt to address these gaps. In this work, a lattice component is designed using a …

An updated protocol based on CLSI document C37 for preparation of off-the-clot serum from individual units for use alone or to prepare commutable pooled serum reference materials

October 30, 2019
Author(s)
Johanna Camara, Uliana Danilenko, Hubert W. Vesper, Gary L. Myers, Patric A. Clapshaw, W. Greg Miller
… Manufacturers of in-vitro diagnostic medical devices, clinical laboratories, … require commutable reference materials that can be used in the calibration hierarchies of medical laboratory … traceability to higher order reference systems. In order to achieve this goal, matrix-based reference …

Inertial Measurement Unit for On-Machine Diagnostics of Machine Tool Linear Axes

October 7, 2016
Author(s)
Gregory W. Vogl, Alkan Donmez, Andreas Archenti, Brian A. Weiss
… measurement unit (IMU) for identification of changes in the translational and angular errors due to axis … accelerometers and rate gyroscopes to identify changes in linear and angular errors due to axis degradation. A … scheduling, supporting more intelligent decision-making by manufacturing personnel and the development of …

Automated uncertainty quantification analysis using system model and data

October 29, 2015
Author(s)
Saideep Nannapaneni, Sankaran Mahadevan, David Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri
… uncertainty can improve decision-making and, thereby, make manufacturing systems more efficient. Accomplishing all of them requires knowledge in four separate domains: statistics, data science, optimization, and, of course, manufacturing. In this paper, we focus on quantifying uncertainty, usually …

Free Space Microwave Non Destructive Characterization of Composite Materials

May 4, 2015
Author(s)
Jan Obrzut, Ahmed M. Hassan, Edward J. Garboczi
… testing of composite materials. The system operates in the Q- frequency band of 30 GHz to 50 GHz with fixed wave … an aluminum plate, and the other from a wave propagating in an air slab with a geometrical propagation length equal to … performance and electrical conductivity. During manufacturing, the carbon-nanotube network evolves from a …
Displaying 6476 - 6500 of 13218
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