Exploring Registration of Optical, CMM and XCT for Verification of Supplemental Surfaces to Define AM Lattices: Application to Cylindrical and Spherical Surfaces

Published

August 25, 2021

Author(s)

Maxwell Praniewicz, Jason Fox, Gaurav Ameta, Felix Kim, Paul Witherell, Christopher Saldana

Abstract

The use of lattice structures produced using additive manufacturing (AM) is of great interest to the aerospace and medical industries because of their potential for strength/weight optimization. However, their use is often limited due to challenges in qualification. Recent standards proposed for the definition and verification of lattice structures created using AM attempt to address these gaps. In this work, a lattice component is designed using a repeated unit cell and theoretical supplemental surfaces (TSS), brought forth in ASME Y14.46, are used to define the bounding geometry of the component. Two planes and a sphere are used to define a datum hierarchy which will be used to qualify the component. A measurand is defined by a spherical TSS and is later used to evaluate the quality of datum registration. The component is produced using a laser powder bed fusion process and then measured using focus variation microscopy, X-Ray computed tomography, and a coordinate measuring machine (CMM). The three data sources are then registered using a refined sampling registration based on the CMM points. The effect of CMM data acquisition strategy on the quality of the registration is then examined. Results show that CMM planning based on optical measurements of the component, as opposed to the designed geometry, show significant improvement in the quality of registration. This work highlights the importance of sampling location in tactile measurements of components produced using additive manufacturing and recommends that definition of inspection locations/methods be integrated into the design cycle of AM parts.

Proceedings Title

Proceedings of the 16th CIRP Conference on Computer Aided Tolerancing

Conference Dates

June 15-17, 2020

Conference Location

Charlotte, NC, US

Conference Title

16th CIRP Conference on Computer Aided Tolerancing

Pub Type

Conferences

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Citation

Praniewicz, M. , Fox, J. , Ameta, G. , Kim, F. , Witherell, P. and Saldana, C. (2021), Exploring Registration of Optical, CMM and XCT for Verification of Supplemental Surfaces to Define AM Lattices: Application to Cylindrical and Spherical Surfaces, Proceedings of the 16th CIRP Conference on Computer Aided Tolerancing, Charlotte, NC, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929475 (Accessed December 12, 2024)