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Search Publications

NIST Authors in Bold

Displaying 6351 - 6375 of 13218

Waveform metrology and a quantitative study of regularized deconvolution

May 1, 2010
Author(s)
Paul D. Hale, Andrew M. Dienstfrey
… perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the … to system response. We characterize the waveform estimates in terms of pulse parameters and total error, comparing … International Instrumentation and Measurement Technology Conference …

Significance Test in Operational ROC Analysis

April 5, 2010
Author(s)
Jin Chu Wu, Alvin F. Martin, Raghu N. Kacker, Robert C. Hagwood
… is taken into account is statistically significant. In the case that the alternative hypothesis is accepted, the … Biometric Technology for Human Identification VII … Significance Test in Operational ROC Analysis …

A Two-Dimensional Terahertz Imaging System Using Hot Electron Bolometer

May 10, 2006
Author(s)
Dazhen Gu, Eyal Gerecht, Fernando Rodriquez Morales, Sigfrid Yngvesson
… is employed as the local oscillator (LO) source, resulting in a very compact setup. Terahertz images are obtained by … The receiver is designed to operate at 850 GHz, but can in principle operate at any terahertz frequency. We produce … The demonstrated overall sensitivity of the imager in terms of NEΔ}T is better than 0.5 K. We are working on …

Development of a Dynamically Reprogrammable NCAP

January 1, 2004
Author(s)
R Kochan, Kang B. Lee, V Kochan, A Sachenko
… (NCAP) that is based on the IEEE 1451 Standard is proposed in this paper. The dynamic reprogramming capability of the … of the NCAP based on a MCS51 microcontroller are proposed in this paper. The evaluation of the computing power of the … IEEE Instrumentation and Measurement Technology Conference …

Properties of Cavity-Backed Slot-Ring Antennas at 95 GHZ

August 1, 2001
Author(s)
Shalva Nolen, Todd E. Harvey, Carl D. Reintsema, Erich N. Grossman
… 210. The patterns have low sidelobe levels of about -15 dB in the H-plane and below -25 dB in the E-plane and a directiveity of 17 dB. We are … array of slot-ring antenna-coupled bolometers for use in a concealed weapons imaging system. … Passive Millimeter-Wave Imaging Technology V …

The Neolithography Consortium

June 1, 2000
Author(s)
James E. Potzick
… The role of process simulation in microlithography is becoming an increasingly important … Advanced Technology/Late-Breaking Developments …

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
… films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution … by SEMATECH and were characterized by several techniques in a SEMATECH-sponsored round robin. Cross sectional TEM … Characterization and Metrology for ULSI Technology Conference …

Polymer Layered-Silicate Nanocomposites: Polyamide-6, Polypropylene and Polystyrene

October 24, 1999
Author(s)
Jeffrey W. Gilman, A B. Morgan, Richard H. Harris Jr., E Manias, E P. Giannelis, M Wuthenow
… In many of the cases studied, polymer-clay nanocomposites are … of nanocomposites also offer measurable improvements in a variety of physical properties. The intercalated … reduced flammability benefits, but with less improvement in physical properties. Many issues are unresolved as to the …

Intercomparison of SEM, AFM, and Electrical Linewidths

June 1, 1999
Author(s)
John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell
… Uncertainty in the locations of line edges dominates the uncertainty … are mirror images of one another, so any modeling error in the position assignment will have opposite signs for the … for SEM, AFM, and ECD measurements of sub-micrometer lines in single crystal Si. Edge positions are determined from SEM …

Spatial Uniformity in Chamber-Cleaning Plasmas Measured Using Planar Laser-Induced Fluorescence

January 1, 1998
Author(s)
Kristen L. Steffens, Mark A. Sobolewski
… of CF 2 density as an indicatior of chemical uniformity in 92% CF 4 square root of O 2 and 50% C 2 F 6 square root of … discharge current and voltage. All measurements were made in the Gaseous Electronics Conference (GEC)reference cell, a … Characterization and Metrology for ULSI Technology Conference …

Cloud-based Accessibility for Voting Applications

December 22, 2015
Author(s)
Shanee T. Dawkins, Sharon J. Laskowski
… (GPII), drawing on work supported by NIDRR, is creating technology for cloud-based accessibility. Using this new technology, users of computer systems can create personal … of this new technology for two key applications: in voting, and in cloud computing applications being …

UV Stabilizer BTMPS in the Illicit Fentanyl Supply in 9 US Locations

February 5, 2025
Author(s)
Chelsea Shover, Morgan Godvin, Meghan Appley, Elise Pyfrom, Fernando Montero Castrillo, Karli Hochstatter, Neil Garg, Adam Koncsol, Joseph Friedman, Caitlin Molina, Ruby Romero, Brendan Harshberger, Jordan Spoliansky, Candace Winstead, Edward Sisco
… called hindered amine light stabilizers that are used in plastics manufacturing and as adhesives or sealants.1 BTMPS has not been studied in humans or approved for human consumption, but animal … UV Stabilizer BTMPS in the Illicit Fentanyl Supply in 9 US Locations …

DEVELOPING AN ACTIVITY MODEL FOR SELECTING DIMENSIONAL-METROLOGY SYSTEMS IN INSPECTION PLANNING

August 9, 2017
Author(s)
Shaw C. Feng, Thomas R. Kramer, John A. Horst, Thomas D. Hedberg Jr., Allison Barnard Feeney
… ties and information flow in dimensional metrology systems based on design information … Technical Conferences & Computers and Information in Engineering Conference … ACTIVITY MODEL FOR SELECTING DIMENSIONAL-METROLOGY SYSTEMS IN INSPECTION PLANNING …

Virtual Factory Framework for Supporting Production Planning and Control

September 2, 2016
Author(s)
Deogratias Kibira, Guodong Shao
… Developing optimal production plans for smart manufacturing systems is challenging if events change … to demonstrate data generation for production planning in a virtual factory. … APMS 2016 International Conference, Advances in Production Management Systems - Production Management …

A Measure of Product Sustainability Based on Triple Bottom Line

June 15, 2009
Author(s)
Prabir Sarkar, Sudarsan Rachuri, Hyo Won Suh, Kevin W. Lyons, Ram D. Sriram
… products. Sustainability is generally expressed in terms of Triple Bottom Line (TBL) - people, planet, and … have positive effects and value for all the stakeholders. In this work, we propose different measures to assess … Technical Conferences & Computers and Information in Engineering Conference IDETC/CIE 2009 …

NIST-ASME Workshop on Uncertainty in Dimensional Measurements

September 1, 2001
Author(s)
Dennis A. Swyt
… A 2 1/2-day workshop on problems in use of uncertainty in dimensional measurements sponsored by NIST and ASME was … by fifty-six representatives of organizations including manufacturing companies, instrument suppliers, standards … NIST-ASME Workshop on Uncertainty in Dimensional Measurements …

LaTeX at MSID

January 1, 1996
Author(s)
Peter Wilson
… paper descibes the LaTeX software environment within the Manufacturing Systems Integration Division (MSID) at NIST. …

Organization of MSID

January 1, 1996
Author(s)
Michelle P. Steves, Donald E. Libes
… and recommendations regarding the organization of MSID''s (Manufacturing systems Integration Division) publicly … Finally, it provides guidelines for MSID staff in organizing information for external dissemination. …
Displaying 6351 - 6375 of 13218
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