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Search Publications

NIST Authors in Bold

Displaying 4176 - 4200 of 13217

Toward Traceability for At Line AFM Dimensional Metrology

January 1, 2002
Author(s)
Ronald G. Dixson, Angela Guerry, Marylyn H. Bennett, Theodore V. Vorburger, Michael T. Postek
… The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that … SEMATECH ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve this …

Intelligent System Control: A Unified Approach and Applications

January 1, 1998
Author(s)
Hui-Min Huang, Harry A. Scott, Elena R. Messina, Maris Juberts, Richard Quintero
… development at the National Institute of Standards and Technology (NIST) aims at designing and developing … Gordon and Breach International Series in Engineering, Technology and Applied Science …

In-situ, Parallel Monitoring of Relative Temperature, Material Emission, and Laser Reflection in Powder-blown Directed Energy Deposition

September 10, 2024
Author(s)
Samantha Webster, Jihoon Jeong, Rujing Zha, Shuheng Liao, Alberto Castro, Lars Jacquemetton, Darren Beckett, Kornel Ehmann, Jian Cao
… In-situ monitoring is critical for developing new control … advanced materials, and toolpath planning strategies in laser beam Directed Energy Deposition (DED-LB). Coaxial … of open-loop and closed-loop process control. We establish in-situ, parallel signals by monitoring multiple process …

Big Data Analytics for Smart Factories of the Future

June 18, 2020
Author(s)
Robert Gao, Lihui Wang, Moneer Helu, Roberto Teti
… how to effectively and efficiently discover patterns in the big data to enhance productivity and economy has … and low veracity, towards the creation of added-value in smart factories of the future. … Digital Manufacturing System, Information, Learning …

Exploring the Kinetic and Thermodynamic Relationship of Charge Transfer Reactions used in Localized Electrodeposition and Patterning in a Scanning Bipolar Cell

May 14, 2019
Author(s)
Trevor M. Braun, D. T. Schwartz
… electrode, involves intricate coupling of the ohmic drop in the electrochemical cell to the thermodynamics and … Frontiers in Chemistry … Electrodeposition, Bipolar electrochemistry, additive manufacturing … Relationship of Charge Transfer Reactions used in Localized Electrodeposition and Patterning in a Scanning …

Lets Talk, Robots

November 21, 2016
Author(s)
Craig I. Schlenoff
… robotics, manufacturing, ontology, knowledge representation …

STEP File Analyzer User's Guide

December 13, 2012
Author(s)
Robert R. Lipman
… file. The spreadsheet simplifies inspecting information in the STEP file at an entity and attributes level. … interoperability, manufacturing, STEP, data exchange …

Linewidth Measurement from a Stitched AFM Image

January 1, 2005
Author(s)
Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger, C Nguyen
… view that the originals cannot.  It has been widely used in photography, medical imaging, and computer vision and … the composite image.  The potential use of image stitching in dimensional metrology is a relatively unexplored field.  In our experiment, a linewidth structure with nearly vertical …

The Structural Evolution of Pore Formation in Low-K Dielectric Thin Films

January 1, 2003
Author(s)
M S. Silverstein, Barry J. Bauer, V. J. Lee, R C. Hedden, B G. Landes, J L. Lyons, B Kern, J Niu, T Kalantar
… angle neutron scattering were used to characterize changes in the porosity, pore size and pore size distribution on … an average radius of 56 . Processing yielded a decrease in porosity to about 11%, an increase in average pore radius to 83 , and a narrower pore size …

Measurement Science Roadmap Workshop for Water Use Efficiency and Water Quality in Premise Plumbing Systems, August 1-2, 2018: Synthesis of a Workshop organized by the National Institute of Standards and Technology, U.S. Environmental Protection Agency, a

December 20, 2018
Author(s)
Robert Pickering, Kathleen Onorevole, Rob Greenwood, Sarah Shadid
… In August 2018, the National Institute of Standards and Technology (NIST), the U.S. Environmental Protection Agency … organized by the National Institute of Standards and Technology, U.S. Environmental Protection Agency, a …

NIST: Responding to Basic Needs, Responding to Special Needs

May 1, 2001
Author(s)
L A. Greenhouse
… The National Institute of Standards and Technology was established by an Act of Congress in 1901 as the National Bureau of Standards (NBS). It was … resided with the Office of Weights and Measures (OWM) in the U.S. Coast and Geodetic Survey. Congress's … national needs, NIST, physical constants, Standards and Technology …

Interoperability Analysis Tool for IEC 61850-9-2 Standard-based Merging Units

February 18, 2019
Author(s)
Yuyin Song, Gerald J. FitzPatrick, Kang B. Lee, Avi M. Gopstein
… huge amount of network communication packet data collected in the test. Therefore, the big challenge we are faced is how … the challenge, the National Institute of Standards and Technology (NIST) has developed an interoperability analysis … physical and simulated MUs provided by seven vendors in the Utilities Communications Architecture International …

New Collaboration Methods for Laboratory Liaisons

June 1, 2006
Author(s)
Nancy Allmang, Mylene S. Ouimette, Lea Wade
… Division of the National Institute of Standards and Technology (NIST) initiated a library-laboratory liaison program. In the programs early years the liaisons performed in-depth research and analyses, worked with researchers to … ACRL Science and Technology Section of ALA Annual Conference 2006 | | | ALA …

Development of a Kinematic Measurement Method for Knee Exoskeleton Fit to a User

August 4, 2020
Author(s)
Roger V. Bostelman, YaShian Li-Baboud, Karl Van Wyk, Mili Shah
… to user impacts the safety of the human robot interaction. In this paper, we develop a method to compare the exoskeleton … to implement, and relatively non-invasive to the user in order to allow the measurement methods to be evaluated in manufacturing facilities where the exoskeletons would be used. …

Workshop on Decarbonization: A Gap Analysis of LCA Standards for Industry

September 20, 2024
Author(s)
Noah Last, Joshua D. Kneifel, Amy Costello, Catherine Houska, Katherine Morris
… ASTM International's committee on sustainability (E60), in collaboration with the National Institute of Standards and Technology (NIST), hosted the virtual "Workshop on … the challenges and opportunities that industry faces in applying life-cycle assessment (LCA) to address …

Scanning Electron Microscope Length Standards (Chapter VII in: Benchmarking the Length Measurement Capabilities of the National Institute of Standards and Technology, R.M. Silver, J.L. Land, Editors, NISTIR 6036)

January 1, 1998
Author(s)
Michael T. Postek, Joseph Fu
… Division within the National Institute of Standards and Technology is benchmarked against those of other leading … Capabilities of the National Institute of Standards and Technology, R.M. Silver, J.L. Land, Editors, NISTIR 6036) …

Development Life Cycle and Tools for XML Content Models

September 1, 2004
Author(s)
Boonserm Kulvatunyou, KC Morris, Jeong Buhwan, Puja Goyal
… semantic models typically evolve and require maintenance. In addition, to promote interoperability and reduce … possible. Semantic components must be consistent and valid in terms of agreed upon standards and guidelines. In this paper, we describe an activity model for creation, …

The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee - Update 2023 -

January 7, 2025
Author(s)
Nicholas G. Paulter Jr., John Jendzurski, Luca De Vito, Sergio Rapuano, Jerome Blair, William Boyer
… of the performance of these devices, which supports technology and product advancement, product comparison and … well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data … for Terminology and Test Methods for Circuit Probes." In development is the IEEE Draft Std. P2414 "Draft Standard …

Evaluation of Carbon Nanotube Probes in Critical Dimension Atomic Force Microscopes

August 26, 2016
Author(s)
Jinho Choi, Byong Chon Park, Sang Jung Ahn, Dal-Hyun Kim, J Lyou, Ronald G. Dixson, Ndubuisi George Orji, Joseph Fu, Theodore V. Vorburger
… devices has placed continuously greater demands on manufacturing metrology-arising both from the measurement … and the growing requirement to characterize structures in more than just a single critical dimension. For scanning … collaborating with the National Institute of Standards and Technology (NIST) on the application of CNT tips for CD-AFM. …
Displaying 4176 - 4200 of 13217
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