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NIST Authors in Bold

Displaying 4151 - 4175 of 13217

Cellulose Nanocrystals the Next Big Nano-thing?

August 6, 2008
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H. Wegner
… like microfibrils that are biosynthesized and deposited in plant material in a continuous fashion. Therefore, the basic raw materials … to be utilized in an array of future materials once the manufacturing processes and nanometrology are fully …

Heat pump concepts for nZEB Technology developments, design tools and testing of heat pump systems for nZEB in the USA, Country report IEA HPT Annex 40 Task 2, Task 3 and Task 4 of the USA

December 8, 2015
Author(s)
William V. Payne, Arthur H. Fanney, William M. Healy, Joshua D. Kneifel, Tania Ullah, Farhad Omar, Steven T. Bushby, Brian P. Dougherty, Dustin G. Poppendieck, Lisa C. Ng
… air properties. • The National Institute of Standards and Technology (NIST) is working on a field study effort on the … Heat pump concepts for nZEB Technology developments, design tools and testing of heat …

Measurement Needs for Biofabrication of Tissue Engineered Medical Products Workshop Report

April 19, 2024
Author(s)
Greta Babakhanova, Carl Simon Jr., Eugenia Romantseva
… December 1, 2022, the National Institute of Standards and Technology (NIST) held a one-day workshop on measurement … for the structure of the constructs, cell viability in the constructs, and functional capacity of the constructs. … standards for different cell types and overall manufacturing processes. The establishment of collaborative …

Test Structure Fundamentals

April 4, 2011
Author(s)
Richard A. Allen
Test structures are critical tools for semiconductor manufacturers, allowing for understanding of the process and individual circuit elements that cannot be acquired from measurements of the circuits, which can have billions of transistors and other

Supporting Production Consistency for Cement

May 12, 2025
Author(s)
Aron Newman, Cody Strack
… Concrete is the second most used substance in the world after water. Concrete manufacturers produce 14 … to decrease its carbon footprint through new materials and manufacturing methods. The particle size and fineness of the … the predecessor to the National Institute of Standards and Technology (NIST), developed an air permeability test in 1943 …

IT Asset Management : Financial Services

September 7, 2018
Author(s)
James M. Banoczi
… descriptions of the architecture, all products used in the build and their individual configurations. … of products, the guide does not endorse these products in particular. Instead, it presents the characteristics and … security, financial sector, asset management, information technology asset management (ITAM), information technology …

Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage

January 1, 2000
Author(s)
E Amatucci, Nicholas Dagalakis, John A. Kramar, Fredric Scire
… The phenomenal growth of opto-electronic manufacturing and future applications in micro and nano manufacturing has raised the need for … The National Institutes of Standards and Technology (NIST) Advanced Technology Program (ATP) has …

Computer-Integrated Knowledge System (CIKS) Networks: Report of the 2nd Workshop

December 1, 1999
Author(s)
L J. Kaetzel
… Construction Materials and Systems (NPCMS) was held in Gaithersburg, MD on September 24th and 25th, 1997. The … Laboratory of the National Institute of Standards and Technology, the Construction Materials Council of the Civil … was to: provide a forum for developing and participating in an industry-wide effort to address the information needs …

Structural Elucidation of Chemical and Post-translational Modifications of Monoclonal Antibodies

October 15, 2015
Author(s)
Wenzhou Li, James L. Kerwin, John E. Schiel, Catherine A. Mouchahoir, Darryl Davis, Andrew Mahan, Sabrina A. Benchaar
… mAb provided by the National Institute of Standards and Technology (NIST). Current and future promising approaches … discussed. Many of the aforementioned techniques were used in the characterization of the NIST mAb Reference Material, the results of which are summarized in this chapter. …

A Resilient Architecture for the Realization and Distribution of Coordinated Universal Time to Critical Infrastructure Systems in the United States: Methodologies and Recommendations from the National Institute of Standards and Technology (NIST)

November 3, 2021
Author(s)
Jeffrey Sherman, Ladan Arissian, Roger Brown, Matthew J. Deutch, Elizabeth Donley, Vladislav Gerginov, Judah Levine, Glenn Nelson, Andrew Novick, Bijunath Patla, Tom Parker, Benjamin Stuhl, Jian Yao, William Yates, Michael A. Lombardi, Victor Zhang, Douglas Sutton
… Division of the National Institute of Standards and Technology (NIST), an agency of the United States Department … from the National Institute of Standards and Technology (NIST) …

Uncertainty Analysis of Thermal Transmission Properties Determined by ASTM C 177

March 1, 2010
Author(s)
Robert R. Zarr
… determined by the National Institute of Standards and Technology (NIST) 1016 mm Guarded-Hot-Plate apparatus is … are presented for the guarded-hot-plate apparatus in the single-sided mode of operation covering specimen heat … building technology, calibration, expanded polystyrene board, fibrous …

Advanced Encryption Standard (AES)

November 26, 2001
Author(s)
National Institute of Standards and Technology (NIST), Morris J. Dworkin, Elaine Barker, James R. Nechvatal, James Foti, Lawrence E. Bassham, E. Roback, James F. Dray Jr.
… National Institute of Standards and Technology (NIST), Morris J. Dworkin , Elaine Barker , James …

Array Based Test Structure for Optical-Electrical Overlay Calibration

March 22, 2007
Author(s)
Byron J. Shulver, Richard A. Allen, Anthony Walton, Michael W. Cresswell, J. T. Stevenson, S Smith, Andrew S. Bunting, P. Durgapal, Alan Gundlach, Les I. Haworth, Alan W. Ross, Anthony J. Snell
… The novel overlay test structure reported in this paper was purposely designed to serve as an … specific reference material. It features standard frame-in-frame optical overlay targets which are embedded in … then measured by the same tool that is being used in the manufacturing process being controlled. Thus it is …

Harmonized Conformance Testing for Product Data Managers

October 1, 2001
Author(s)
David Flater, KC Morris
… The Testability of Interaction-Driven Manufacturing Systems project seeks to enhance the design-for-testability of specifications for manufacturing software interfaces, derive a test method that … is usable for interaction-driven manufacturing systems in general, and foster the reuse of testing artifacts. For …

Metrology and process control: dealing with measurement uncertainty

Author(s)
James E. Potzick
… Metrology is often used in designing and controlling manufacturing processes. A product sample is processed, some … can be remarkably effective for the complex processes used in semiconductor manufacturing, but there is some risk …

Spot Test Kits for Detecting Lead in Household Paint: A Laboratory Evaluation

May 1, 2000
Author(s)
Walter J. Rossiter Jr, M Vangel, M E. McKnight, G Dewalt
… of spot test kits for detecting the presence of lead in household paint when tests were conducted by certified … to give a pink or red color. These eight kits were used in an experiment investigating the effect of lead level, lead … and substrate did not generally show significant effects in cases where the spot test kits appeared to be candidates …

Securing Electronic Health Records on Mobile Devices

July 27, 2018
Author(s)
Gavin W. O'Brien, Nate V. Lesser, Brett Pleasant, Sue Wang, Kangmin Zheng, Colin Bowers, Kyle Kamke
… According to our own risk analysis, discussed here, and in the experience of many health care providers, mobile devices can present vulnerabilities in a health care organization's networks. At the 2012 Health … health care organizations of varying sizes and information technology sophistication. Specifically, the guide shows how …

Applications of Surface Metrology in Firearm Identification

January 8, 2014
Author(s)
Xiaoyu Alan Zheng, Johannes A. Soons, Theodore V. Vorburger, Jun-Feng Song, Thomas Brian Renegar, Robert M. Thompson
… by a trained examiner using a comparison microscope. In 2009, a report by the National Academies called into … of error rates. The National Institute of Standards and Technology (NIST) uses its experience in surface metrology to develop objective identification …

Surface Topography Analysis for a Feasibility Assessment of a National Ballistics Imaging Database

May 1, 2007
Author(s)
Theodore V. Vorburger, James H. Yen, B Bachrach, Thomas Brian Renegar, Li Ma, Hyug-Gyo Rhee, Xiaoyu Alan Zheng, Jun-Feng Song, Charles D. Foreman
… the weapon that generated the spent casing or bullet. In the same fashion that the national fingerprint database … (EEEL) of the National Institute of Standards and Technology (NIST). The study was conducted by members of OLES, NIST's Manufacturing Engineering Laboratory (MEL), NIST's …

Toward Traceability for At-line AFM Dimensional Metrology

July 1, 2003
Author(s)
Marylyn H. Bennett, Angela Guerry, Ronald G. Dixson, Michael T. Postek, Theodore V. Vorburger
… The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that … (ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve this …

Toward Traceability for At Line AFM Dimensional Metrology

January 1, 2002
Author(s)
Ronald G. Dixson, Angela Guerry, Marylyn H. Bennett, Theodore V. Vorburger, Michael T. Postek
… The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that … SEMATECH ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve this …

Modeling MCPTT and User Behavior in ns-3

September 9, 2021
Author(s)
Wesley Garey, Thomas Henderson, Yishen Sun, Richard A. Rouil, Samantha Gamboa Quintiliani
… To support the advancement of public safety communications technology, the Third Generation Partnership Project (3GPP) … (LTE) networks. As this is a new service that can be used in dire situations, it is imperative that the behavior and … insights and evaluate the performance of this service. In this paper we will describe MCPTT based on 3GPP …
Displaying 4151 - 4175 of 13217
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