Allen, R.
(2011),
Test Structure Fundamentals (Accessed April 28, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Test Structure Fundamentals
Published
Author(s)
Abstract
Test structures are critical tools for semiconductor manufacturers, allowing for understanding of the process and individual circuit elements that cannot be acquired from measurements of the circuits, which can have billions of transistors and other circuit elements. Using test structures, the manufacturer can measure parameters such as the dimensions of features and the performance of individual transistors, determine the variability of nominally identical transistors, and project the reliability of the circuit.Pub Type
Talks
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created April 4, 2011, Updated February 19, 2017