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Displaying 17126 - 17150 of 17291

Thickness Evaluation for 2nm SiO2 Films, a Comparison of Ellipsometric, Capacitance-Voltage and HRTEM Measurements

September 30, 2003
Author(s)
James R. Ehrstein, Curt A. Richter, Deane Chandler-Horowitz, Eric M. Vogel, Donnie R. Ricks, Chadwin Young, Steve Spencer, Shweta Shah, Dennis Maher, Brendan C. Foran, Alain C. Diebold, Pui-Yee Hung
We have completed a comparison of SiO2 film thicknesses obtained with the three dominant measurement techniques used in the IC industry . This work is directed at evaluating metrology capability that might support NIST- traceable Reference Materials for

Effects of Hydrolytic Degradation on In Vitro Biocompatibility of Poly (d,l-lactic acid)

March 1, 2002
Author(s)
S Yoneda, William F. Guthrie, David S. Bright, C A. Khatri, Francis W. Wang
Objective: In order to investigate the effects of hydrolytic degradation on the biocompatibility of poly (d,l-lactic acid) [P(d,l-LA], the initial attachment and the mitochondrial activity of MC3T3-El osteoblast-like cells on various degraded P(d,l-LA)

Calibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy

November 1, 2000
Author(s)
A R. Kalukin, B Winn, S S. Wang, C Jacobsen, Zachary H. Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray miscroscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are
Displaying 17126 - 17150 of 17291
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