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Search Publications

NIST Authors in Bold

Displaying 3876 - 3900 of 17264

Performance Evaluation Facility for LADARs

April 12, 2004
Author(s)
Geraldine S. Cheok, William C. Stone
… This growth is reflected in the National Institute of Standards and Technology s (NIST) experience with research …

Photometry: Sensing Light Color

September 1, 2001
Author(s)
Yoshihiro Ohno, Steven W. Brown
… candela, colorimetry, display, LED, lumen, photometry, standards, uncertainty, units …

Modeling Load Variations with Artificial Neural Networks to Improve on Wafer OSLT Calibrations

December 1, 2000
Author(s)
Jeffrey Jargon, P. Kirby, Kuldip Gupta, Lawrence P. Dunleavy, T. Weller
… (TRL) calibration. The open, short, and thru standards do not vary significantly from wafer to wafer, so we also model these standards with ANNs using ANNs trained with calibrated … with varying load terminations using the ANN-modeled standards, and find that they compare favorably (a difference …

A 350-GHz high-resolution high-sensitivity passive video imaging system

April 27, 2010
Author(s)
Daniel T. Becker, James A. Beall, Hsiao-Mei Cho, William Duncan, Kent D. Irwin, Gene C. Hilton, Robert D. Horansky, Peter J. Lowell, Michael D. Niemack, Nicholas G. Paulter Jr., Carl D. Reintsema, Francis J. Schima, Robert E. Schwall, Ki W. Yoon, Peter Ade, Carole Tucker, Simon Dicker, Mark Halpern
… video imaging system. This demonstration system uses 800 photon-noise-limited superconducting transition edge …

Metrology at the Nanoscale: What are the Grand Challenges?

August 6, 2008
Author(s)
Kevin W. Lyons, Michael T. Postek
… methods (off-line and in-process applications), and standards. To meet the needs of the emerging integrated … To illustrate the value of metrology and the role of standards to facilitate product realization a number of … 2006 that were focused on metrology, instrumentation, and standards. …

Josephson junctions with nearly superconducting metal silicide barriers

November 23, 2005
Author(s)
Yonuk Chong, Nicolas Hadacek, Paul Dresselhaus, Charles J. Burroughs, Burm Baek, Samuel Benz
We present a detailed study of the electrical properties of Nb-based planar Josephson junctions with superconducting metal silicide barriers, TiSi2 and WSi2. While these non-hysteretic junctions are useful for voltage standard applications, they are also

Realization and dissemination of activity standards for medically important alpha-emitting radionuclides

March 4, 2022
Author(s)
Denis E. Bergeron, Karsten Kossert, Sean Collins, Andrew Fenwick
… reported on the development and comparison of activity standards for medically important alpha-emitters. This review … the relevant methods and models underpinning these standards, the generation of new nuclear decay data, and the … Realization and dissemination of activity standards for medically important alpha-emitting radionuclides …

Standards for Validation of Cancer Biomarkers

April 2, 2005
Author(s)
Catherine D. O'Connell, Donald H. Atha, J P. Jakupciak
… order for tests to be reimbursed by insurance companies. Standards providing guidance and reference materials assuring … Standards for Validation of Cancer Biomarkers …

Mobile Robot and Mobile Manipulator Research Towards ASTM F45 Standards Developments

April 20, 2016
Author(s)
Roger V. Bostelman, Tsai H. Hong
… Performance standards for industrial mobile robots and mobile … This paper discusses work at the National Institute of Standards and Technology (NIST) and within the ASTM Committee … Automatic Guided Industrial Vehicles. This includes standards for both terminology, F45.91, and for navigation …

An IEEE 1451.5-802.11 Standard-based Wireless Sensor Network with Embedded WTIM

May 12, 2011
Author(s)
Eugene Song, Kang B. Lee, Steven E. Fick, Alkan Donmez
… Electrical and Electronics Engineers (IEEE) 1451.5-802.11 standard-based wireless sensor network (WSN) developed at the … in Java language according to the IEEE 1451.5-802.11 standard. The embedded WTIM, a wireless sensor node, was developed based on the IEEE 1451.5-802.11 standard on a single board computer in Dynamic C language. …

OAGi/NIST Workshop on Open Cloud Architecture for Smart Manufacturing

April 20, 2016
Author(s)
Nenad Ivezic, Boonserm Kulvatunyou, Yan Lu, Yunsu Lee, Jaehun Lee, Albert W. Jones, Simon P. Frechette
… Manufacturing, which was held at the National Institute of Standards and Technology on May 5, 2015. The workshop was a … Manufacturing, Cloud Architectures, Internet of Things, Standards Development, Standards Adoption, Digital Manufacturing, Industry 4.0 …

Comparisons of Estimators of process standard deviation in constructing Shewhart control charts with unequal subgroup sizes

January 20, 2010
Author(s)
Nien F. Zhang, P Winkel
… and used in practice. Several estimators of the process standard deviation based on sample standard deviations have been proposed in constructing the … charts based on the recommended estimator of the process standard deviation is also discussed … Comparisons of Estimators of process standard deviation in constructing Shewhart control charts …
Displaying 3876 - 3900 of 17264
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