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Displaying 2601 - 2625 of 17262

Optical Phase-coherent Link Between an Optical Atomic Clock and 1550-nm Mode-locked Lasers

June 1, 2003

Author(s)

Kevin W. Holman, David J. Jones, Steven T. Cundiff, Jun Ye, John B. Schlager, Erich P. Ippen

… coherence between 1550-nm mode-locked laser sources and an 800-nm femtosecond frequency comb serving as the clockwork …

Optical Fine Structure of II-VI and III-V Nanocrystals: The Role of d Orbitals in a Tight-Binding Approach

October 12, 2021

Author(s)

J G. Diaz, Garnett W. Bryant, W Jaskolski

The electronic structure of GaAs and CdSe nanocrystals is studied by using a nearest-neighbor tight-binding model extended to include d orbitals. Our results show that the inclusion of $d$ orbitals in a minimal basis set is necessary for a proper

Junction Yield Analysis for 10 V Programmable Josephson Voltage Standard Devices

December 5, 2014

Author(s)

Anna E. Fox, Paul D. Dresselhaus, Alain Rufenacht, Aric W. Sanders, Samuel P. Benz

… and Technology 10 V Programmable Josephson Voltage Standard (PJVS) has been performed by fabricating and … Programmable Josephson voltage standard, Josephson junctions, superconducting films, … Yield Analysis for 10 V Programmable Josephson Voltage Standard Devices …

Implementation of the NIST Community Resilience Planning Guide for Buildings and Infrastructure Systems

October 4, 2018

Author(s)

Maria K. Dillard, Jennifer F. Helgeson, Stephen A. Cauffman

… The National Institute of Standards and Technology (NIST) published the Community … Guide for Buildings and Infrastructure Systems (NIST SP 1190) in October 2015. The Guide describes a six-step …

Measurements and Predictions of Light Scattering by Clear Coatings

May 1, 2001

Author(s)

M E. McKnight, Theodore V. Vorburger, Egon Marx, Maria E. Nadal, P Y. Barnes, Michael A. Galler

… (STARR) developed by the National Institute of Standards and Technology. Comparisons between measured and … with rms roughness values of approximately 3, 150, and 800 nm for an angle of incidence of 20 . …

Calibration of Thin-Film Thermocouples on Silicon Wafers

June 1, 1999

Author(s)

Kenneth G. Kreider, Dean C. Ripple, D P. DeWitt

… thin-film thermometers was less then 0.2% of the emf at 800 C. …

The Ampere and Electrical Standards

January 1, 2001

Author(s)

Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams

… of the six original divisions of the National Bureau of Standards. The Electricity Division provides dc and … Division staff included the development of precision standards, such as Rosa and Thomas standard resistors and the … NIST research has helped to develop and refine electrical standards using the quantum Hall effect and the Josephson …

The Residual Resistance Ratio of High-Purity Platinum

August 22, 2011

Author(s)

Weston L. Tew, William E. Murdock, Michal J. Chojnacky, Dean C. Ripple

… National Conference of Standards Laboratories International 2011 …

NIST Certification of Metallurical Standard Reference Materials for Microanalysis - A Short History

October 16, 2008

Author(s)

Ryna B. Marinenko

… testing, homogeneity, microanalysis standards, NBS SRMs, Standard Reference Materials … NIST Certification of Metallurical Standard Reference Materials for Microanalysis - A Short …

Microwave Radiometric Standards Development at the U.S. National Institute of Standards and Technology

December 1, 2011

Author(s)

Dave K. Walker

… competitiveness by advancing measurement science, standards, and technology in ways that enhance economic … to the GRSS community, including measurement support and standards for optical radiometry and photometry, space … chemistry, and statistical data analysis. Radiometric standards and metrology at NIST span the UV, visible, IR, …

Overlay Measurements and Standards

May 1, 1995

Author(s)

Richard M. Silver, James E. Potzick, Robert D. Larrabee

… improve the measurement of overlay error, and to develop standards in support of overlay metrology. The approach of the first step is to develop a toolkit of standards for characterizing the tool-induced shifts (TIS) in … of the first step, is aimed at developing artifact standards with negligible wafer-induced shifts for the …

Standard cell calibrations:

January 1, 1987

Author(s)

Bruce F Field

… Standard cell calibrations: …

Hydrocarbon vapors standards:

January 1, 1981

Author(s)

James E Brown

… Hydrocarbon vapors standards: …

Molecular diagnostics: Harmonization through reference materials, documentary standards and proficiency testing

September 1, 2011

Author(s)

Marcia J. Holden, Roberta M. Madej, Philip Minor, Lisa V. Kalman

… overview of reference materials, related documentary standards, and proficiency testing programs. The review … DNA, nucleic acid testing, NAT, documentary standards, molecular methods, genetic testing, proficiency … Harmonization through reference materials, documentary standards and proficiency testing …

Experimental demonstration of a receiver beating the standard quantum limit for multiple nonorthogonal coherent-state discrimination

January 6, 2013

Author(s)

Francisco E. Becerra Chavez, Jingyun Fan, Gerald Baumgartner, Julius Goldhar, Jonathan Kosloski, Alan L. Migdall

… for state discrimination sensitivities surpassing the standard quantum limit (SQL). Realizing quantum receivers … quantum mechanics, standard quantum limit, metrology, coherent states, state … Experimental demonstration of a receiver beating the standard quantum limit for multiple nonorthogonal …

National Institute of Standards and Technology Office of International and Academic Affairs Activities Report for FY 2001/2002

October 16, 2008

Author(s)

S F. Heller-Zeisler

… The National Institute of Standards and Technology maintains outreach in the … National Institute of Standards and Technology Office of International and Academic …

National Institute of Standards and Technology Office of International and Academic Affairs Activities Report for FY 1999/2000

June 1, 2002

Author(s)

S F. Heller-Zeisler

… The National Institute of Standards and Technology maintains outreach in the … National Institute of Standards and Technology Office of International and Academic …

ITL Publishes Guidance on Enterprise Patch Management Technologies

August 8, 2013

Author(s)

Elizabeth B. Lennon

… summarizes a new ITL publication, NIST Special Publication 800-40 Revision 3, Guide to Enterprise Patch Management …

ITL Issues Guidelines for Managing the Security of Mobile Devices

July 15, 2013

Author(s)

Elizabeth B. Lennon

… announces the publication of NIST Special Publication 800-124 Revision 1, Guidelines for Managing the Security of …

Certification of standard reference material 2372a human DNA quantitation standard:

March 1, 2018

Author(s)

Erica L Romsos, Margaret C Kline, David L Duewer, Blaza Toman, Natalia Farkas

… Certification of standard reference material 2372a human DNA quantitation standard: …

Certification of Standard Reference MaterialA(R) 5000: Calibrated Overlay Wafer Standard:

January 1, 2007

Author(s)

Michael T. Stocker, Richard M. Silver, Ravikiran Attota, Jay S. Jun

… Certification of Standard Reference MaterialA(R) 5000: Calibrated Overlay Wafer Standard: …

Standard Reference Materials ::Tin freezing-point standard - SRM 741a/

January 1, 1999

Author(s)

Natalia P Moiseeva, Gregory F Strouse

… Standard Reference Materials ::Tin freezing-point standard - SRM 741a/ …

Standard Reference Materials:Enthalpy and heat capacity standard reference material

January 1, 1977

Author(s)

D A Ditmars, T B Douglas, A Cezariliyan, S Ishihara

… Standard Reference Materials:Enthalpy and heat capacity standard reference material …

Standard Reference Materials ::Calibrated glass standards for fission track use/

January 1, 1974

Author(s)

G Michael Reimer, B Stephen Carpenter

… Standard Reference Materials ::Calibrated glass standards for fission track use/ …

Standard Reference Materials ::Standard quartz cuvettes for high accuracy spectrophotometry/

January 1, 1973

Author(s)

J W Lazar, R Mavrodineanu

… Standard Reference Materials ::Standard quartz cuvettes for high accuracy spectrophotometry/ …

Advanced communications
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Buildings and Construction
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