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Displaying 2076 - 2100 of 4635
George W. Mulholland, K D. Childs, D Narum, L A. LaVanier, P M. Lindley, B W. Schueler, A C. Diebold
… of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and energy dispersive x-ray … by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With …
L Holzer, R Flatt, S.T. Erodgan, Jeffrey W. Bullard, Edward Garboczi
… of particles in the 20 υm 60 υm size range, and a focused ion beam technique to examine the 3-D shape of cement … Grinding, Shape, X-ray Microcomputed Tomography, Focused Ion Beam …
Galen C. O'Neil, Peter J. Lowell, Joel N. Ullom, Jason M. Underwood
In a refrigerator, heat is moved from one system to another and this movement requires an additional dissipated power. It is desirable to both isolate the cooled system, so that its temperature may differ from the bath, and to heatsink the heated system so
… in vacuum. Starting at 90 C there is an increase in ion intensity at fixed laser energy. By 150 C the integrated total ion intensity had grown by six fold indicating that melting did indeed increase ion yield. At 150 C the threshold laser intensity to produce …
The Negative-Bias-Temperature-Instability (NBTI) is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast recovery of NBTI degradation immediately after stress is removed has recently become a hot topic
A tensile test procedure that accommodates specimens with gauge section 25 μm by 70 μm by 300 μm was developed and demonstrated. The instrumentation and technique were adapted from those previously developed and used to test thin films. This required
Holger Laabs, Richard D. Jones, Christopher L. Cromer, Marla L. Dowell, V. Liberman
… energy measurements. The materials we tested were nickel-plated sapphire, chemically-vapor-deposited silicon carbide (CVD SiC), nickel-plated copper, and polished copper. Applied pulse energy …
David G. Holmberg, Kenneth D. Steckler, C A. Womeldorf, William L. Grosshandler
The National Institute of Standards and Technology (NIST) presently conducts heat flux sensor calibrations using standard radiation methods. In practice, however, many heat flux sensors are used in test environments where convective heat transfer dominates
Dwight S. Seferos, A S. Blum, James G. Kushmerick, Guillermo Bazan
… orbital topology of the OPV with one thiol bound to a gold surface (the geometry in the STM experiment) with the … topology of the molecule with both thiol termini bound to gold (relevant to C-AFM). In the former case, a single …
A C. Pipino, John T. Woodward IV, Curtis W. Meuse, Vitalii I. Silin
… of the localized surface plasmon resonance (SPR) of a gold nanoparticle distribution to adsorption of … is provided by the intrinsic granularity of an ultra-thin, gold film, having a nominal thickness of . 0.18 nm. The …
Edward Sisco, Jennifer R. Verkouteren, Jessica L. Staymates, Jeffrey Lawrence
… analysis in real time mass spectrometry (TD- DART-MS) and ion mobility spectrometry (IMS) as tools for the rapid and … Seizure Screening using Thermal Desorption DART-MS and Ion Mobility Spectrometry …
Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving