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Displaying 751 - 775 of 1916

Fast, All-Optical, Zero to PI Continuously Controllable Kerr Phase Gate

March 13, 2013
Author(s)
Runbing Li, Lu Deng, Edward W. Hagley
We demonstrate a fast-responding Kerr phase gate using a room-temperature 85Rb vapor operated in a Raman gain scheme where the probe/signal wave travels “superluminally”. Continuously controllable nonlinear Kerr phase shift of the probe wave from 0 to π

NIST Virtual/Physical Random Profile Roughness Calibration Standards

October 1, 1998
Author(s)
Jun-Feng Song, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Theodore V. Vorburger, Y B. Yuan
The NIST (National Institute of Standards and Technology) virtual/physical surface roughness calibration standard consists of physical specimens whose surfaces are manufactured by a numerically controlled diamond-turning process using digitized profiles
Displaying 751 - 775 of 1916
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