U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 401 - 425 of 2289

Rheology of Poly(ethylene oxide) Clay Solutions

August 1, 2002
Author(s)
Sheng Lin-Gibson, G Schmidt, Jai A. Pathak, Charles C. Han
… Poly(ethylene oxide) and Laponite, a synthetic hectorite clay, form highly … Rheology of Poly(ethylene oxide) Clay Solutions …

Reliability of Ultra-Thin Silicon Dioxide Under Combined Substrate Hot Electron and Constant Voltage Tunneling Stress

June 1, 2000
Author(s)
Eric M. Vogel, John S. Suehle, Bin Wang, Y Chen, J B. Bernstein
… hot electron and tunneling electrical stress of silicon oxide ranging in thickness from 2.0 nm to 3.5 nm is reported. … to explain the time-to-breakdown behavior of ultra-thin oxide under simultaneous tunneling and substrate hot electron … CMOS, defects, electron, oxide, reliability, silicon, stress …

Charge transfer stabilization of late transition metal oxide nano-particles on a layered niobate support

December 10, 2015
Author(s)
Megan E. Strayer, Thomas Senftle, Jonathan P. Winterstein, Nella M. Vargas-Barbosa, Renu Sharma, Robert M. Rioux, Michael J. Janik, Thomas Mallouk
… interactions between late transition metal/metal oxide nanoparticles and oxide supports impact catalysts' activity and stability. … interactions for late transition metal and metal oxide nanoparticles on layered niobate and silicate supports. … Charge transfer stabilization of late transition metal oxide nano-particles on a layered niobate support …

Magnetic switching fluctuations from sidewall oxides in MgO/FeCoB magnetic tunnel junctions

August 30, 2011
Author(s)
Joshua M. Pomeroy, J C. Read
… switching distributions with coupling to magnetic sidewall oxides in FeCoB/MgO magnetic tunnel junctions (MTJs) are … “checkerboard” pattern that implies coupling to magnetic oxides on the MTJ sidewalls. … Magnetic switching fluctuations from sidewall oxides in MgO/FeCoB magnetic tunnel junctions …

Evaluation of sources of variability in a nitric oxide screening assay for engineered nanomaterials

November 18, 2025
Author(s)
Tariq Fahmi, Robert Gutierrez, Ana Barrios, Tae Joon Cho, John Elliott, Sanghamitra Majumdar, Bryant Nelson, Aaron Johnston-Peck, Alessandro Tona, Anil Patri, Elijah Petersen
… an evaluation of sources of uncertainty in a nitric oxide screening assay to monitor nitric oxide production in RAW 264.7 cells when exposed to ENMs. … Evaluation of sources of variability in a nitric oxide screening assay for engineered nanomaterials …

In Situ Gas Phase Diagnostics for Hafnium Oxide Atomic Layer Deposition

January 1, 2008
Author(s)
James E. Maslar, Wilbur S. Hurst, Donald R. Burgess Jr., William A. Kimes, Nhan V. Nguyen, Elizabeth F. Moore, Joseph T. Hodges
… of a project to develop in situ diagnostics for hafnium oxide ALD processes.  The focus is on an examination of the … warm-wall, horizontal-flow reactor during hafnium oxide ALD involving tetrakis(ethylmethylamino) hafnium and … In Situ Gas Phase Diagnostics for Hafnium Oxide Atomic Layer Deposition …

NIST Gold Nanoparticle Reference Materials Do Not Induce Oxidative DNA Damage

February 1, 2013
Author(s)
Bryant C. Nelson, Donald H. Atha, John T. Elliott, Bryce J. Marquis, Elijah J. Petersen, Danielle Cleveland, Stephanie S. Watson, I-Hsiang Tseng, Andrew Dillon, Melissa Theodore, Joany Jackman
… need. We evaluated AuNPs for their potential to induce oxidative damage to DNA using calf-thymus DNA in a cell-free … and in vivo genotoxicity testing platforms investigating oxidative damage to DNA, as well as other forms of DNA damage. … NIST Gold Nanoparticle Reference Materials Do Not Induce Oxidative DNA Damage …

Broadband Dielectric Spectroscopy Detection of Volatile Organic Compounds with ZnO Nanorod Gas Sensors

January 29, 2021
Author(s)
Papa K. Amoah, Pengtao Lin, Helmut Baumgart, Yaw S. Obeng, Rhonda R. Franklin
… Metal-oxide semiconductor gas sensors based on chemical resistivity … can be applied to study discrete processes on metal-oxide sensing material, such as zinc oxide (i.e. ZnO) surfaces, when exposed to a redox-active … contactless broadband microwaves, semiconductor metal oxide, ZnO, sensing, volatile organic compounds (VOC), …

In Situ Characterization of Gas-Phase Species Present During Hafnium Oxide Atomic Layer Deposition

January 1, 2007
Author(s)
James E. Maslar, Wilbur S. Hurst, Donald R. Burgess Jr., William A. Kimes, Nhan V. Nguyen
… in the gas phase during atomic layer deposition of hafnium oxide were investigated in an attempt to gain insight into the chemistry of this system. Hafnium oxide was deposited on a silicon substrate using … of Gas-Phase Species Present During Hafnium Oxide Atomic Layer Deposition …

Selective Oxidation of Glycerol by Highly Active Bimetallic Catalysts at Ambient Temperature under Base Free Conditions

August 24, 2011
Author(s)
Andrew A. Herzing, Gemma L. Brett, Peter Miedziak, Nikolaos Dimitratos, Meenakshisundaram Sankar, Marco Conte, Jose A. Lopez-Sanchez, David W. Knight, Stuart H. Taylor, Graham J. Hutchings, Qian He, Christopher J. Kiely
… supported on Mg(OH)2 are highly active for the selective oxidation of glycerol under base-free conditions at ambient … could lead to bench-top reaction procedures for alcohol oxidation. To the best of our knowledge, these results … for AuPt alloy nanoparticles in order to facilitate the oxidation of polyols with molecular oxygen under mild …

Effect of Oxide and Nitride Films on Strength of Silicon: A Study Using Controlled Small-Scale Flaws

December 1, 2004
Author(s)
Yeon-Gil G. Jung, Antonia Pajares, Brian R. Lawn
… Strength properties of silicon substrates containing dense oxide and nitride surface films are investigated using … crack sources in the substrate. Deposition of the oxide films increases the strength while the nitride films … to the presence of residual compressive stress in the oxide, tensile stress in the nitride. A fracture mechanics …

Measurement of the Antineutrino Spectrum from 235U Fission at HFIR with PROSPECT

June 28, 2019
Author(s)
Hans Pieter Mumm, Denis E. Bergeron, Mark Tyra, Svetlana Nour, Jerome LaRosa
… operating 7.9 m from the 85MWth highly-enriched uranium (HEU) High Flux Isotope Reactor. With a … prediction equal in size to that observed at low-enriched uranium power reactors in the e energy region of 5-7 MeV. …

Residual stress determination by diffraction: Modeling and applications

January 1, 2004
Author(s)
Davor Balzar, N C. Popa
… symmetry and general triclinic sample symmetry of the uranium sample. The strain tensor was determined Dy the … from the neutron TOF measurements at LANSCE. An annealed uranium plate was used as a reference sample, thus providing …

Absolute line intensities for the nu3 band of oxirane (C2H4O)

November 15, 2013
Author(s)
Walter J. Lafferty, Jean-Marie Flaud, Fridolin Kwabia, A. Perrin, M. Ngom
… transform spectra of the ν3 band of oxirane (ethylene oxide) have been recorded with different pressures and used … ethlyene oxide, line intensities, nu3 band intensity, oxirane …

VISCOSITY AND DENSITY OF ALUMINUM OXIDE NANOLUBRICANT

May 8, 2013
Author(s)
Mark A. Kedzierski
… measurements of a synthetic polyolester-based aluminum oxide (Al2O3) nanoparticle dispersion (nanolubricant) at … VISCOSITY AND DENSITY OF ALUMINUM OXIDE NANOLUBRICANT …
Displaying 401 - 425 of 2289
Was this page helpful?