Residual stress determination by diffraction: Modeling and applications

Published

January 1, 2004

Author(s)

Davor Balzar, N C. Popa

Abstract

Residual stress plays an important role in shaping Iilaterials properties. We present both the method to determine texture-weighted strain orientation distribution function for arbitrary crystal and sample symmetries and an example of the determination of the average macroscopic strain tensor as applied to the orthorhombic crystal symmetry and general triclinic sample symmetry of the uranium sample. The strain tensor was determined Dy the least-squares refinement of interplanar spacings for 19 Bragg reflections, as determined from the neutron TOF measurements at LANSCE. An annealed uranium plate was used as a reference sample, thus providing reference interplanar spacings for all 19 reflections. The resulting strain and stress tensors show strong shear components that could not be detected through the measurements customary carried out 31ong a few principal directions in the sample.

Citation

Computer Modeling Eng. Sci.

Pub Type

Journals

Keywords

neutron diffraction, residual stress, Rietveld refinement

Citation

Balzar, D. and Popa, N. (2004), Residual stress determination by diffraction: Modeling and applications, Computer Modeling Eng. Sci. (Accessed December 12, 2024)