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Displaying 1426 - 1450 of 3087

Conductive Carbon Nanotubes for Semiconductor Metrology

August 10, 2010
Author(s)
Joseph J. Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
… Metrology, and Standards for Nanomanufacturing IV, Proceedings of SPIE Volume: 7767 …

Etch induced microwave losses in titanium nitride superconducting resonators

June 25, 2012
Author(s)
Martin O. Sandberg, Jeffrey S. Kline, Martin P. Weides, David S. Wisbey, David P. Pappas
… were investigated: fluorine- and chlorine-based reactive ion etches and an argon-ion mill. At high microwave probe powers, the reactive etched resonators showed low internal loss, whereas the ion- milled samples showed dramatically higher loss. At …

Pores in Marcellus Shale: A Neutron Scattering and FIB-SEM Study

January 26, 2015
Author(s)
Xin Gu, David R. Cole, Gernot Rother, David F. Mildner, Susan L. Brantley
… plane of bedding. Neutron scattering combined with focused ion beam scanning electron microscope (FIB-SEM) reveals that … focused ion beam electron microscopy, nitrogen gas adsorption, …

Supercontinuum Sources for Metrology

June 2, 2009
Author(s)
John T. Woodward IV, Allan W. Smith, Colleen A. Jenkins, Chungsan Lin, Steven W. Brown, Keith R. Lykke
… John T. Woodward IV , Allan W. Smith , Colleen A. Jenkins, Chungsan Lin, …

Trapped Ions and Laser Cooling, VI

February 13, 2002
Author(s)
James C. Bergquist, John J. Bollinger, Wayne M. Itano, David J. Wineland
… Trapped Ions and Laser Cooling, VI …
Displaying 1426 - 1450 of 3087
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