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Search Publications

NIST Authors in Bold

Displaying 826 - 850 of 3086

Sizing the Bacillus anthracis PA63 Channel with Nonelectrolyte Poly(ethylene glycols)

August 1, 2008
Author(s)
Brian J. Nablo, Kelly Halverson, Joseph W. Robertson, Tam Nguyen, Rekha Panchal, Rick Gussio, Sina Bavari, Oleg V. Krasilnikov, John J. Kasianowicz
… glycol), PEG, were used to estimate the diameter of the ion channel formed by Bacillus anthracis protective antigen … anthrax, channel size, edema factor, ion channel, lethal factor, poly(ethylene glycol), protective …

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
… generation in an Ar filled hollow waveguide, triggers ion emission from the specimen apex. The composition measured … is not known a priori. The possible thermal and athermal ion emission mechanisms that may be operating in EUV APT are … Field Ion Emission in an Atom Probe Microscope Triggered by …

Structure and Property Characterization of Porous Low-k Dielectric Constant Thin Films Using X-ray Reflectivity and Small Angle Neutron Scattering

February 1, 2001
Author(s)
Eric K. Lin, Wen-Li Wu, C Jin, J T. Wetzel
… A novel methodology using a combination of high energy ion scattering, x-ray reflectivity, and small angle neutron … porous thin films for use as low-k dielectric materials. Ion scattering is used to determine the elemental composition … ion scattering spectroscopy, low-k dielectric material, …

Experiments at NIST with Trapped Ions: 3-D Zero-Point Cooling, Quantum Gates, Bragg Scattering, and Atomic Clocks

June 12, 1995
Author(s)
C Monroe, A S. Barton, James C. Bergquist, D J. Berkeland, John Bollinger, F C. Cruz, Wayne M. Itano, Steven R. Jefferts, Branislav M. Jelenkovic, B E. King, D M. Meekhof, J D. Miller, M E. Poitzsch, Joseph N. Tan
… transitions in the resolved sideband regime to cool single ions to the n = 0 zero-point energy. This has allowed … Experiments at NIST with Trapped Ions: 3-D Zero-Point Cooling, Quantum Gates, Bragg …

Dissipative production of a maximally entangled steady state of two quantum bits

December 19, 2013
Author(s)
John P. Gaebler, Yiheng Lin, Florentin Reiter, Ting Rei Tan, Ryan S. Bowler, Anders Sorensen, Dietrich G. Leibfried, David J. Wineland
Entangled states are a key resource in fundamental quantum physics, quantum cryptography, and quantum computation [1]. To date, controlled unitary interactions applied to a quantum system, so-called "quantum gates'', have been the most widely used method

Major International Lead (Pd)-Free Solder Studies

October 16, 2008
Author(s)
C A. Handwerker, E E. de Kluizenaar, K Suganuma, Frank W. Gayle
… by law, by tax, or by market pressure, to replace tin-lead eutectic solders in electronic assemblies. Over the … Europe, and Japan to examine solder-based alternatives to tin-lead eutectic solder and to understand the implications …

Energy Broadening of Neutron Depth Profiles by Thin Polyamide Films

September 7, 2022
Author(s)
Jamie Weaver, Anna Job, Kedar Manandhar, Ichiro Takeuchi, Robert Gregory Downing
… (NDP) measurements of sensitive materials (e.g., Li-ion batteries). Addition of this layer can increase NDP … Neutron Depth Profiling, Li-ion batteries, thin-films …

Hyperfine Coherence in the Presence of Spontaneous Photon Scattering

July 15, 2005
Author(s)
R Ozeri, C. Langer, John D. Jost, B. L. DeMarco, A. Ben-Kish, Brad R. Blakestad, Joseph W. Britton, J Chiaverini, Wayne M. Itano, David Hume, Dietrich G. Leibfried, Till P. Rosenband, Piet Schmidt, David J. Wineland
… of hyperfine-state superpositions of a trapped 9 Be + ion is experimentally studied in the presence of off-resonant …

Observation of a fault tolerance threshold with concatenated codes

December 9, 2025
Author(s)
Grace Sommers, Michael Foss-Feig, David Hayes, David Huse, Michael Gullans
… noise. We implement our state preparation protocol on ion-trap hardware with added noise to demonstrate the … quantum computing, quantum error correction, ion traps …

Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen, Chang Xu, James Batteas
… Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl … rates, damage cross sections, and overall secondary ion stability) were monitored as a function of temperature. … Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of …
Displaying 826 - 850 of 3086
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