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NIST Authors in Bold

Displaying 926 - 950 of 2538

Miniature all-solid-state heterostructure nanowire Li-ion batteries as a tool for engineering and structural diagnostics of nanoscale electrochemical processes.

August 15, 2014
Author(s)
Vladimir P. Oleshko, Thomas F. Lam, Dmitry A. Ruzmetov, Paul M. Haney, Henri J. Lezec, Albert Davydov, Sergiy Krylyuk, John Cumings, Albert A. Talin
… and phase transformations that govern the operation of Li-ion batteries (LiBs) require detailed nanoscale 3D structural … Miniature all-solid-state heterostructure nanowire Li-ion batteries as a tool for engineering and structural …

Combining secondary ion mass spectrometry image depth profiling and single particle inductively coupled plasma mass spectrometry to investigate the uptake and biodistribution of gold nanoparticles in Caenorhabditis elegans

May 20, 2021
Author(s)
Monique Johnson, Joe Bennett, Antonio Montoro Bustos, Shannon Hanna, Andrei Kolmakov, Nicholas Sharp, Elijah Petersen, Christopher Sims, Bryant Nelson, Patricia Lapasset
… assessments. Here, we combine the use of dynamic secondary ion mass spectrometry (dynamic SIMS) and single particle … Combining secondary ion mass spectrometry image depth profiling and single …

Quantum Projection Noise: Population Fluctuations in 2-Level Systems

January 1, 1993
Author(s)
Wayne M. Itano, James C. Bergquist, John J. Bollinger, J M. Gilligan, D J. Heinzen, F L. Moore, M G. Raizen, David J. Wineland
… are available. In the experiments described here, a single ion or a few identical ions were prepared in well-defined … of the energy levels were then measured. For an individual ion, the outcome of the measurement is uncertain, unless the …

Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

July 31, 1996
Author(s)
George W. Mulholland, K D. Childs, D Narum, L A. LaVanier, P M. Lindley, B W. Schueler, A C. Diebold
… of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and energy dispersive x-ray … by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With …

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002
Author(s)
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
… using light microscopy, electron microscopy and secondary ion mass spectrometry (SIMS). SIMS has demonstrated that the … oxide inclusions, sample preparation, secondary ion mass spectrometry, Standard Reference Material 482 …

Asymmetric Enhanced Intermixing in Co/Ti Bilayer

October 12, 2021
Author(s)
P Sule, L Kotis, L Toth, M. Menyhard, William F. Egelhoff Jr.
… Low-energy ion-beam intermixing has been studied by Auger depth … the occurrence of the asymmetry of intermixing at 2 keV ion energy. At lower ion energies the asymmetry vanishes progressively with the …

Probing Accelerated Salt-Induced Relaxation Dynamics of Laponite Suspensions Using X-Ray Photon Correlation Spectroscopy Measurements and Molecular Dynamics Simulations

December 22, 2022
Author(s)
Sohaib Mohammed, Meishen Liu, Qingteng Zhang, Suresh Narayanan, Fan Zhang, Greeshma Gadikota
… followed by CsCl and MgCl2 salts. The competing effects of ion size and charge on the relaxation behavior are noted. For … ions shows that higher charge dominates the size of the ion. The trends in the relaxation behavior are consistent … suspensions is accelerated in the presence of salts, with ion sizes and charges having a competing effect on the …
Displaying 926 - 950 of 2538
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