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Direct imaging of highly charged ions in an electron beam ion trap

Published

Author(s)

James V. Porto, I Kink, John D. Gillaspy
Citation
Review of Scientific Instruments
Volume
71

Citation

Porto, J. , Kink, I. and Gillaspy, J. (2000), Direct imaging of highly charged ions in an electron beam ion trap, Review of Scientific Instruments (Accessed May 27, 2024)

Issues

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Created January 1, 2000, Updated February 17, 2017