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Displaying 301 - 325 of 423

Conductive Carbon Nanotubes for Semiconductor Metrology

August 10, 2010
Author(s)
Joseph J. Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
… Metrology, and Standards for Nanomanufacturing IV, Proceedings of SPIE Volume: 7767 …

Supercontinuum Sources for Metrology

June 2, 2009
Author(s)
John T. Woodward IV, Allan W. Smith, Colleen A. Jenkins, Chungsan Lin, Steven W. Brown, Keith R. Lykke
… John T. Woodward IV , Allan W. Smith , Colleen A. Jenkins, Chungsan Lin, …

Characterization of Reference Materials 8690 to 8693

February 13, 2023
Author(s)
Jessica Reiner, Benjamin Place, N. Alan Heckert, Katherine Peter, Alix Rodowa
… (PFAS) in Aqueous Film-Forming Foams (AFFF) Formulation IV deliver non-certified values of the identity and quantity …

Performance of New and Aged Residential Fire Sprinklers

August 31, 2011
Author(s)
Anthony D. Putorti Jr., William F. Guthrie, Jason D. Averill, Richard G. Gann
… to an accelerated aging protocol, the Battelle Class IV corrosivity environment. Sprinklers from all three sets …
Displaying 301 - 325 of 423
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