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Measured Versus Predicted Performance of Building Integrated Photovoltics

Published

Author(s)

Mark W. Davis, Arthur H. Fanney, Brian P. Dougherty

Abstract

The lack of predictive performance tools creates a barrier to the widespread use of building integrated photovoltaic panels. The National Institute of Standards and Technology (NIST) has created a building integrated photovoltaic (BIPV) test bed to capture experimental data that can be used to improve and validate previously developed computer simulation tools. Twelve months of performance data has been collected for building integrated photovoltaic panels using four different cell technologies crystalline, polycrystalline, silicon film, and triple-junction amorphous. Two panels using each cell technology were present, one without any insulation attached to its rear surface and one with insulation having a nominal thermal resistance value of 3.5 m2 K/W attached to its rear surface. The performance data associated with these eight panels, along with meteorological data, was compared to the predictions of a photovoltaic model developed jointly by Maui Solar Software and Sandia National Laboratories (SNL), which is implemented in their IV Curve Tracer software [1]. The evaluation of the predictive performance tools was done in the interest of refining the tools to provide BIPV system designers with a reliable source for economic evaluation and system sizing.
Citation
Journal of Solar Energy Engineering-Transactions of the Asme
Volume
125
Issue
No. 1

Keywords

building integrated, mono-crystalline, photovoltaic, polycrystalline, predictive performance tools, silicon film, test bed

Citation

Davis, M. , Fanney, A. and Dougherty, B. (2003), Measured Versus Predicted Performance of Building Integrated Photovoltics, Journal of Solar Energy Engineering-Transactions of the Asme, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860906 (Accessed July 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 1, 2003, Updated February 19, 2017